Standards meetings are open to all, but you must be a SEMI Standards Program Member to attend.
If you are not a Member, please register for the International SEMI Standards Program and start making a big contribution to the industry’s progress, complete an application form today!
Questions? Contact your local staff coordinator: Click here
Off
Add to Calendar2021-11-17 00:00:002021-11-17 00:00:00Traceability North America TC Chapter Fall Meeting 2021Traceability North America TC Chapter
Fall Meeting 2021
Date: Wednesday, November 17, 2021
Time: 8:00 AM-1:00 PM Pacific
Online via Virtual Meeting
AGENDA
(subject to change)
Last updated: November 15, 2021
NOTE:
Standards meetings are open to all, but you must be a SEMI Standards Program Member to attend.
If you are not a Member, please register for the International SEMI Standards Program and start making a big contribution to the industry’s progress, complete an application form today!
Questions? Contact your local staff coordinator: Click here Online, Pacific Time United StatesSEMI.org[email protected]America/Los_Angelespublic
9:00 am - 5:30 pm
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Add to Calendar2021-09-28 09:00:002021-09-28 17:30:00BIPV TASK FORCE MEETINGBIPV TASK FORCE MEETING
光伏建筑一体化（BIPV）屋顶抗风揭试验方法标准交流会ChinaSEMI.org[email protected]America/Los_Angelespublic
10:00 am - 11:30 am
Off
Add to Calendar2021-09-17 10:00:002021-09-17 11:30:004H-SiC Homoepitaxial Wafer Task Force Meeting 会议邀请：4H-SiC同质外延片工作组线上会议
4H-SiC Homoepitaxial Wafer Task Force Meeting
Meeting：Link
Friday, September 17, 2021
10:00-11:30ChinaSEMI.org[email protected]America/Los_Angelespublic
Do you sometimes feel like you are operating in the dark when dealing with the new challenges and opportunities in process and design? These continue to emerge in parallel to ever shrinking semiconductor device geometries.
While Moore’s law and beyond are driving scale reduction, the industry is facing increased process sensitivity and complexity, and is redefining on-wafer defect tolerance in terms of size and complexity.
To detect, identify, understand the source and eliminate yield limiter defectivity are key for total wafer environment contamination characterization and control and are essential for yield enhancement to ensure the success of the latest technology nodes.
It is more imperative than ever that the semiconductor industry works together to enable improved defect detection, speciation/characterization metrology, and as needed, hybrid analytical technology for upcoming HVM readiness.
Join us for this session for speakers and discussion on tackling some of these industry challenges.
Virtual United States
7:30 am
-
7:35 am
Paul Trio
Senior Manager, Strategic Initiatives
SEMI
Welcome
7:35 am
-
7:55 am
Archita Sengupta
Sr. Technologist
Intel
IDM Perspective of Defectivity with regard to Next-Gen Metrology and Analysis Tools
New challenges and opportunities in process and design continue to emerge in parallel to ever shrinking semiconductor device geometries. While Moore’s law and beyond are driving scale reduction, the industry is facing increased process sensitivity and complexity, and is redefining on-wafer defect tolerance in terms of size and complexity.
Join us for this webinar-like session to discuss best-known methods from industry leaders
Challenges in Metrology & Analysis for Next Gen Semiconductor Industry
7:30 am - 10:00 am
Off
Add to Calendar Disabled
America/Los_Angeles
Flexible Hybrid Electronics (FHE) Japan TC Chapter Meeting
Standards meetings are open to all, but you must be a SEMI Standards Program Member to attend.
If you are not a Member, please register for the International SEMI Standards Program and start making a big contribution to the industry’s progress, complete an application form today!
Questions? Contact your local staff coordinator: Click here
3:00 pm - 5:00 pm
Off
Add to Calendar2022-01-14 15:00:002022-01-14 17:00:00Flexible Hybrid Electronics (FHE) Japan TC Chapter MeetingFLEXIBLE HYBRID ELECTRONICS (FHE) JAPAN TC CHAPTER MEETING
Date: Friday, January, 2022
Time: 15:00 - 17:00 [Japan Standard Time]
via Web Conference
AGENDA
Standards Contact Information:
Keigo Nakajima
Coordinator, SEMI Japan
Email: [email protected]
Phone: 81.3.3222.5863
NOTE:
Standards meetings are open to all, but you must be a SEMI Standards Program Member to attend.
If you are not a Member, please register for the International SEMI Standards Program and start making a big contribution to the industry’s progress, complete an application form today!
Questions? Contact your local staff coordinator: Click hereSEMI Japan Office 市ヶ谷 九段南4-7-15 千代田区 Tokyo 1020074 JapanSEMI.org[email protected]Asia/Tokyopublic
Asia/Tokyo
Standards meetings are open to all, but you must be a SEMI Standards Program Member to attend.
If you are not a Member, please register for the International SEMI Standards Program and start making a big contribution to the industry’s progress, complete an application form today!
Questions? Contact your local staff coordinator: Click here
10:00 am - 12:00 pm
Off
Add to Calendar2021-12-24 10:00:002021-12-24 12:00:00Traceability Japan TC Chapter MeetingTRACEABILITY JAPAN TC CHAPTER MEETING
Date: December 24, 2021
Time: 10:00-12:00 [JST]
via Web Conference
AGENDA
Standards Contact Information:
Keigo Nakajima
Coordinator, SEMI Japan
Email: [email protected]
Phone: 81.3.3222.5863
NOTE:
Standards meetings are open to all, but you must be a SEMI Standards Program Member to attend.
If you are not a Member, please register for the International SEMI Standards Program and start making a big contribution to the industry’s progress, complete an application form today!
Questions? Contact your local staff coordinator: Click hereSEMI Japan Office 九段南4-7-15 千代田区 Tokyo 1020074 JapanSEMI.org[email protected]Asia/Tokyopublic
Asia/Tokyo
Standards meetings are open to all, but you must be a SEMI Standards Program Member to attend.
If you are not a Member, please register for the International SEMI Standards Program and start making a big contribution to the industry’s progress, complete an application form today!
Questions? Contact your local staff coordinator: Click here
10:00 am - 11:30 am
Off
Add to Calendar2021-10-06 10:00:002021-10-06 11:30:00Liquid Chemicals North America TC Chapter Fall Meeting 2021Liquid Chemicals
North America TC Chapter
Fall Meeting
Date: Wednesday, October 6, 2021
Time: 10:00-11:30 AM Pacific
via Virtual Meeting
AGENDA
(Subject to change)
Last updated: September 6, 2021
NOTE:
Standards meetings are open to all, but you must be a SEMI Standards Program Member to attend.
If you are not a Member, please register for the International SEMI Standards Program and start making a big contribution to the industry’s progress, complete an application form today!
Questions? Contact your local staff coordinator: Click here
Online, Pacific Time United StatesSEMI.org[email protected]America/Los_Angelespublic
MEMS/NEMS North America TC Chapter Fall Meeting 2021
Standards meetings are open to all, but you must be a SEMI Standards Program Member to attend.
If you are not a Member, please register for the International SEMI Standards Program and start making a big contribution to the industry’s progress, complete an application form today!
Questions? Contact your local staff coordinator: Click here
1:30 pm - 2:30 pm
Off
Add to Calendar2021-09-29 13:30:002021-09-29 14:30:00MEMS/NEMS North America TC Chapter Fall Meeting 2021MEMS/NEMS
North America TC Chapter
Fall Meeting
Date: Wednesday, September 29, 2021
Time: 1:30-2:30 PM Pacific
via Virtual Meeting
AGENDA
(Subject to change)
Last updated: September 20, 2021
NOTE:
Standards meetings are open to all, but you must be a SEMI Standards Program Member to attend.
If you are not a Member, please register for the International SEMI Standards Program and start making a big contribution to the industry’s progress, complete an application form today!
Questions? Contact your local staff coordinator: Click here
Online, Pacific Time United StatesSEMI.org[email protected]America/Los_Angelespublic
