Standards meetings are open to all, but you must be a SEMI Standards Program Member to attend.
If you are not a Member, please register for the International SEMI Standards Program and start making a big contribution to the industry’s progress, complete an application form today!
Questions? Contact your local staff coordinator: Click here
1:00 pm - 3:00 pm
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Add to Calendar2021-03-17 13:00:002021-03-17 15:00:00Traceability Japan TC Chapter MeetingTraceability Japan TC Chapter
Japan Standards Spring 2021 Meetings
Wednesday, March 17, 2021
SEMI Japan, Tokyo, Japan
13:00 – 15:00
AGENDA
1 Welcome / Call to Order
Introductions
Meeting Reminders
2 Agenda Review
Review and Approval of Previous Meeting Minutes
3 Liaison Report
North America TC Chapter
Staff Report
4 Ballot Review
5 Subcommittee & Task Force Reports
5 Year Review Task Force
Japan Single Device Traceability (SDT) liaison TF
Japan Equipment and Materials Traceability (EMT) liaison TF
Panel Level Packaging (PLP) Glass Carrier ID Marking Task Force
Blockchain TF
6 Old Business
5 Year Review Check
SNARF Project Period Check
7 New Business
Type III Liaison
8 Action Item Review
Open Action Items
New Action Items
9 Next Meeting and Adjournment
Standards Contact Information:
Hirofumi Kanno
Coordinator, SEMI Japan
Email: [email protected]
Phone: 81.3.3222.5949
NOTE:
Standards meetings are open to all, but you must be a SEMI Standards Program Member to attend.
If you are not a Member, please register for the International SEMI Standards Program and start making a big contribution to the industry’s progress, complete an application form today!
Questions? Contact your local staff coordinator: Click hereSEMIジャパン 市ヶ谷 1-17 千代田区 九段南, Tokyo 1020074 JapanSEMI.org[email protected]Asia/Tokyopublic
Asia/Tokyo
Voltage Sag Workshop for Manufacturing Fabs
Registration Details
Member Price: $99.00
Note: Use company email address to log in for automatic recognition as a member. Members must be current SEMI Members for member discounts.
During the workshop recording, you will hear perspectives from the key stakeholder segments and develop a greater understanding of the overall efforts and progress of the task force.
The workshop is focused on diagnosing and improving SEMI F47, Specification for Semiconductor Processing Equipment Voltage Sag Immunity, widely adopted across the industry, the governing standard that defines voltage sag test levels and requirements for semiconductor tools.
Since the implementation of SEMI F47, the vulnerability of semiconductor manufacturing to single-phase and two-phase voltage sags has improved greatly. However, semiconductor manufacturers continue to experience significant product loss and downtime due to voltage sag events.
Given the ongoing issues with semiconductor plant downtime, a new SEMI Voltage Sag Immunity Task Force was formed to take a fresh look at the issue. The workshop and the task force:
Reviews the characteristics of the power quality events that cause downtime.
Takes a new look at the sensitivities in the process equipment.
Determines any potential adjustments to equipment design, facility design, utility systems, or SEMI Standards to further reduce voltage sag induced losses by the semiconductor industry.
Principal Project Manager & Leader, Voltage Sag Immunity Task Force
EPRI
Introduction to the SEMI Voltage Sag Immunity Task Force Effort
A review of the key objectives of the voltage sag task force will be discussed along with the characteristics of the power quality events that are still causing semiconductor plant process downtime. A new look at the sensitivities in the tooling and process equipment is required to determine any potential adjustments to equipment design, facility design, utility systems or standards to further reduce voltage sag induced losses by the semiconductor industry. This important work will help utilities, semiconductor manufacturers, and tool equipment providers to better understand the tolerance and susceptibility of today’s generation of semiconductor processing tools and then to develop effective strategies to improve uptime and lower product losses due not only to single-phase (Type I) and two-phase (Type II) voltage sag events but for three-phase (Type III) events as well.
10:25 am
-
10:50 am
Clayton Burns
Principal Engineer
National Grid
Regional Voltage Sags- Importance of Addressing Three-Phase Voltage Sags in SEMI F47
A review of voltage sags at a National Grid substation which were produced by two lightning-caused three-phase transmission faults at locations fairly remote to the substation. This will show the regional effect of transmission level faults on voltage. The voltage sags will be compared to the existing SEMI-F47 standard and the accepted sag definition. Additionally, a proposed regional voltage sag study will be considered in light of the changing make-up of the future electric system and the influx of large inverter-based resources.
10:50 am
-
11:15 am
Ed McGann
Manager of Engineering
VELCO
Utility Dynamic VAR device fault response, fault mitigation techniques, and power quality measures addressed with protection design
VELCO recently conducted a refurbishment of its STATCOM facility as part of a planned controls system upgrade. The system planning need for this facility is to provide area voltage support during transmission system contingencies. The refurbishment project team recognized the benefits of the STATCOM’s ability to provide voltage support during system faults and specified fault performance requirements in the vendor specifications. This presentation will discuss those performance requirements, review pre and post project upgrade system fault record’s and review project lessons learned. The second half of the presentation will cover utility fault mitigation design strategies for substation and transmission line assets as well as protective relaying techniques to improve power quality
11:15 am
-
11:50 am
Michael Noth
Power System Managing Engineer
Austin Energy
Seeing it from both sides: The importance of Power Quality Metering at the utility and inside the Fab Distribution System.
In this presentation we will discuss the importance of having power quality-based metering on both sides of the point of connection and other parts of the distribution system. Mike will share some examples and stories of how important that can be.
11:50 am
-
12:15 pm
Dan Sabin & Tony Hunt
Schneider Electric
Waveform captures of voltage sag events can be automatically analyzed by software to determine their source and impact
This presentation will summarize efforts to categorize events automatically that exceed SEMI F47 limits, and to determine the source of those disturbances. It will also present recent efforts to analyze the impact of voltage sags automatically on electrical loads. This research has resulted in automatic algorithms to determine which voltage sags caused downtime and which ones did not. Combining all of this information together provides a means to more precisely and effectively diagnose, manage, and mitigate voltage sag disturbances.
12:15 pm
-
12:25 pm
Christopher "Dale" Moffitt
Electrical Systems Engineering
HP
Power Quality and Monitoring, What Does the Data Tell Us?
Power Quality (PQ) has a long and diverse history dating back to the first power grids in the United States. Impacts and concerns about PQ events have evolved and will continue to evolve as our usage of electricity changes. Recent natural disasters have highlighted the importance of a robust power grid and the changing landscape of power generation presents new PQ challenges. As power consumers, a key element in any PQ strategy is adequate power monitoring. This provides the data that can drive conversation with the utility, discover opportunities in our infrastructure and deliver to our facilities the power quality necessary to sustain our businesses.
12:25 pm
-
12:50 pm
Willem Meijs & Giel Croonen
Low Voltage expert in electrical engineering on supply distribution system for machines
ASML
SEMI F47 and Power Quality Perspectives and Considerations from a Tool OEM
This presentation will address power quality perspectives and consideration from the point of a lithographic tools manufacture. Effect of different test methods on the sag immunity, test strategy on systems, sub-systems and components. How to divide a large installation up in to testable units and maintaining performance integrity. 3 phase type III test generator topology and the impact on harmonic emission and immunity in relation to voltage sag immunity.
12:50 pm
-
1:15 pm
Josh Pankratz
Director of Engineering
Advanced Energy, Inc.
Power Supply Considerations and Standards for Voltage Sag Ride Through
Disturbances in utility power during semiconductor manufacturing can result in loss of revenue, productivity, production yields, and product quality. Focus on power quality continues to grow as new fabs are built in developing regions, which historically suffer from poor infrastructure. Highly automated fabs have driven a demand for systems that can ride through power glitches without shutting down tools and production lines. This presentation examines how power quality, most typically resulting in voltage sag events, affects semiconductor manufacturing and how industry standards and guidelines for tool immunity to those events affect the design of power supplies.
1:15 pm
-
1:40 pm
Steve Lewis
Lam Research
Round Table Discussion & Q&A
1:40 pm
-
1:55 pm
Mark Stephens
Principal Project Manager
EPRI
Next Steps for SEMI Voltage Sag Immunity Task Force
Based on the initial findings from utility and fab power quality data, the task force is poised to move forward to re-evaluate semiconductor tools against voltage sag additional characteristics that are indicative of measured events still causing downtime. Utilities, semiconductor fabs and equipment OEMs will be invited to actively participate in this effort to obtain the required test data.
SEMI & EPRI invite you to view a workshop held on April 21, 2021, to hear perspectives from all stakeholders on a persistent and difficult issue in microelectronics manufacturing - uncertain power quality. As work on SEMI Standard F47, the Specification for Semiconductor Processing Voltage Sag Immunity, continues this is the opportunity to hear from distinct parts of the supply chain.
Voltage Sag for Manufacturing Fabs - A Workshop
10:00 am - 2:00 pm
Off
Add to Calendar2021-04-21 10:00:002021-04-21 14:00:00Voltage Sag Workshop for Manufacturing FabsSEMI & EPRI invite you to view a workshop held on April 21, 2021, to hear perspectives from all stakeholders on a persistent and difficult issue in microelectronics manufacturing - uncertain power quality. As work on SEMI Standard F47, the Specification for Semiconductor Processing Voltage Sag Immunity, continues this is the opportunity to hear from distinct parts of the supply chain. United StatesSEMI.org[email protected]America/Los_Angelespublic
America/Los_Angeles
Hirofumi Kanno Manager, Standards, SEMI Japan Email: [email protected]
Note: Standards meetings are open to all, but you must be a SEMI Standards Program Member to attend. If you are not a Member, please join the Standards Program and start making a big contribution to the industry’s progress, complete an application form today.
3:00 pm - 5:00 pm
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Add to Calendar2021-06-18 15:00:002021-06-18 17:00:00Liquid Chemicals Japan TC Chapter MeetingLiquid Chemicals JAPAN TC CHAPTER MEETING
June 18, 2021 15:00-17:00 Japan Standard Time
SEMI Japan office, Tokyo
AGENDA
STANDARDS CONTACT INFORMATION:
Hirofumi Kanno
Manager, Standards, SEMI Japan
Email: [email protected]
Note: Standards meetings are open to all, but you must be a SEMI Standards Program Member to attend. If you are not a Member, please join the Standards Program and start making a big contribution to the industry’s progress, complete an application form today.SEMIジャパン 市ヶ谷 1-17 千代田区 九段南, Tokyo 1020074 JapanSEMI.org[email protected]Asia/Tokyopublic
Asia/Tokyo
3D Packaging & Integration Taiwan TC Chapter Meeting
Hirofumi Kanno Manager, Standards, SEMI Japan Email: [email protected]
Note: Standards meetings are open to all, but you must be a SEMI Standards Program Member to attend. If you are not a Member, please join the Standards Program and start making a big contribution to the industry’s progress, complete an application form today.
9:00 am - 12:00 pm
Off
Add to Calendar2021-04-14 09:00:002021-04-14 12:00:00PI&C Japan TC Chapter MeetingPI&C JAPAN TC CHAPTER MEETING
April 14, 2021 9:00-12:00 Japan Standard Time
SEMI Japan office, Tokyo
AGENDA（TBA）
STANDARDS CONTACT INFORMATION:
Hirofumi Kanno
Manager, Standards, SEMI Japan
Email: [email protected]
Note: Standards meetings are open to all, but you must be a SEMI Standards Program Member to attend. If you are not a Member, please join the Standards Program and start making a big contribution to the industry’s progress, complete an application form today.SEMIジャパン 市ヶ谷 1-17 千代田区 九段南, Tokyo 1020074 JapanSEMI.org[email protected]Asia/Tokyopublic
Asia/Tokyo
Hirofumi Kanno Manager, Standards, SEMI Japan Email: [email protected]
Note: Standards meetings are open to all, but you must be a SEMI Standards Program Member to attend. If you are not a Member, please join the Standards Program and start making a big contribution to the industry’s progress, complete an application form today.
1:30 pm - 5:00 pm
Off
Add to Calendar2021-04-13 13:30:002021-04-13 17:00:00Automation Technology Japan TC Chapter MeetingAUTOMATION TECHNOLOGY JAPAN TC CHAPTER MEETING
April 13, 2021 13:30-17:30 Japan Standard Time
SEMI Japan office, Tokyo
AGENDA（TBA）
STANDARDS CONTACT INFORMATION:
Hirofumi Kanno
Manager, Standards, SEMI Japan
Email: [email protected]
Note: Standards meetings are open to all, but you must be a SEMI Standards Program Member to attend. If you are not a Member, please join the Standards Program and start making a big contribution to the industry’s progress, complete an application form today.SEMIジャパン 市ヶ谷 1-17 千代田区 九段南, Tokyo 1020074 JapanSEMI.org[email protected]Asia/Tokyopublic
Asia/Tokyo
Standards meetings are open to all, but you must be a SEMI Standards Program Member to attend.
If you are not a Member, please register for the International SEMI Standards Program and start making a big contribution to the industry’s progress, complete an application form today!
Questions? Contact your local staff coordinator: Click here
Traceability North America TC Chapter Meeting
Off
Add to Calendar2021-02-24 00:00:002021-02-24 00:00:00Traceability North America TC Chapter MeetingTraceability North America TC Chapter Meeting
Date: Wednesday, February 24, 2021
Time: 10:00 AM - 12:30 PM Pacific
via Virtual Meeting
AGENDA
(subject to change)
Last updated: February 23, 2021
NOTE:
Standards meetings are open to all, but you must be a SEMI Standards Program Member to attend.
If you are not a Member, please register for the International SEMI Standards Program and start making a big contribution to the industry’s progress, complete an application form today!
Questions? Contact your local staff coordinator: Click here Online, Pacific Time United StatesSEMI.org[email protected]America/Los_Angelespublic
On September 28th, the fall meeting of the SEMI Standards China HB-LED TC & Compound Semiconductor Materials TC were successfully held at Grand New Century Hotel Yiwu. More than 110 committee members, consisting of experts from more than 40 enterprises and scientific research institutions attended the meeting, including Epiworld, CRRC, AMEC, NORSTEL-FJ, GHTOT, Monocrystal, NAURA, Dynax, AK OPTICS, MigeLab, Tianli, Xinguan Technology, Sinopatt, JINGAN, SMTC, BST, Enkris Semiconductor, Innoscience, GUSU LAB, HIT, CETC 13, etc.
