Standards meetings are open to all, but you must be a SEMI Standards Program Member to attend.
If you are not a Member, please register for the International SEMI Standards Program and start making a big contribution to the industry’s progress, complete an application form today!
Questions? Contact your local staff coordinator: Click here
4:30 pm - 6:30 pm
Off
Add to Calendar2021-07-29 16:30:002021-07-29 18:30:00Compound Semiconductor Materials Europe TC Chapter Meeting Compound Semiconductor Materials Europe TC Chapter Meeting
Date: Thursday, July 29, 2021
Time: 04:30-06:30 PM CEST
via Web Conference
AGENDA
(subject to change)
Last updated: May 31, 2021
NOTE:
Standards meetings are open to all, but you must be a SEMI Standards Program Member to attend.
If you are not a Member, please register for the International SEMI Standards Program and start making a big contribution to the industry’s progress, complete an application form today!
Questions? Contact your local staff coordinator: Click hereOnline, CEST GermanySEMI.org[email protected]America/Los_Angelespublic
Standards meetings are open to all, but you must be a SEMI Standards Program Member to attend.
If you are not a Member, please register for the International SEMI Standards Program and start making a big contribution to the industry’s progress, complete an application form today!
Questions? Contact your local staff coordinator: Click here
2:00 pm - 4:00 pm
Off
Add to Calendar2021-07-14 14:00:002021-07-14 16:00:00Microlithography North America TC Chapter Meeting Microlithography North America TC Chapter Meeting
Date: Wednesday, July 14, 2021
Time: 02:00-04:00 PM Pacific
via Web Conference
AGENDA
(subject to change)
Last updated: May 25, 2021
NOTE:
Standards meetings are open to all, but you must be a SEMI Standards Program Member to attend.
If you are not a Member, please register for the International SEMI Standards Program and start making a big contribution to the industry’s progress, complete an application form today!
Questions? Contact your local staff coordinator: Click hereOnline, Pacific Time United StatesSEMI.org[email protected]America/Los_Angelespublic
Compound Semiconductor Materials Europe TC Chapter Meeting
Standards meetings are open to all, but you must be a SEMI Standards Program Member to attend.
If you are not a Member, please register for the International SEMI Standards Program and start making a big contribution to the industry’s progress, complete an application form today!
Questions? Contact your local staff coordinator: Click here
4:30 pm - 6:30 pm
Off
Add to Calendar2021-04-29 16:30:002021-04-29 18:30:00Compound Semiconductor Materials Europe TC Chapter MeetingCompound Semiconductor Materials Europe TC Chapter Meeting
Date: Thursday, April 29, 2021
Time: 04:30-06:30 PM CEST
via Web Conference
AGENDA
(subject to change)
Last updated: March 30, 2021
NOTE:
Standards meetings are open to all, but you must be a SEMI Standards Program Member to attend.
If you are not a Member, please register for the International SEMI Standards Program and start making a big contribution to the industry’s progress, complete an application form today!
Questions? Contact your local staff coordinator: Click hereOnline, CEST GermanySEMI.org[email protected]America/Los_Angelespublic
1.0 Welcome / Call to Order
1.1 Introductions
1.2 Meeting Reminders
1.3 Agenda Review
2.0 Review and Approval of Previous Meeting Minutes
3.0 Committee Leadership Change
4.0 Liaison Report
4.1 Europe TC Chapter
4.2 North America TC Chapter
4.3 Staff Report
5.0 Ballot Review - None
6.0 Subcommittee & Task Force Reports – No Report
6.1 Liquid Filter TF
6.2 Liquid-Borne Particle Counter TF
6.3 Diaphragm Valve TF
6.4 Welding Fitting TF
6.5 Trace Metal Analysis for High Pure IPA TF
7.0 Old Business
8.0 New Business
9.0 Action Item Review
9.1 Open Action Items
9.2 New Action Items
10.0 Next Meeting and Adjournment
STANDARDS CONTACT INFORMATION:
Hirofumi Kanno Manager, Standards, SEMI Japan Email: [email protected]
Note: Standards meetings are open to all, but you must be a SEMI Standards Program Member to attend. If you are not a Member, please join the Standards Program and start making a big contribution to the industry’s progress, complete an application form today.
1:00 pm - 3:00 pm
Off
Add to Calendar2021-01-29 13:00:002021-01-29 15:00:00Liquid Chemicals Japan TC Chapter MeetingLiquid Chemical Japan TC Chapter meeting
Friday, January 29, 2021, 13:00-15:00 [JST]
SEMI Japan office, Tokyo, Japan
Agenda
1.0 Welcome / Call to Order
1.1 Introductions
1.2 Meeting Reminders
1.3 Agenda Review
2.0 Review and Approval of Previous Meeting Minutes
3.0 Committee Leadership Change
4.0 Liaison Report
4.1 Europe TC Chapter
4.2 North America TC Chapter
4.3 Staff Report
5.0 Ballot Review - None
6.0 Subcommittee & Task Force Reports – No Report
6.1 Liquid Filter TF
6.2 Liquid-Borne Particle Counter TF
6.3 Diaphragm Valve TF
6.4 Welding Fitting TF
6.5 Trace Metal Analysis for High Pure IPA TF
7.0 Old Business
8.0 New Business
9.0 Action Item Review
9.1 Open Action Items
9.2 New Action Items
10.0 Next Meeting and Adjournment
STANDARDS CONTACT INFORMATION:
Hirofumi Kanno
Manager, Standards, SEMI Japan
Email: [email protected]
Note: Standards meetings are open to all, but you must be a SEMI Standards Program Member to attend. If you are not a Member, please join the Standards Program and start making a big contribution to the industry’s progress, complete an application form today.SEMIジャパン 市ヶ谷 1-17 千代田区 九段南, Tokyo 1020074 JapanSEMI.org[email protected]Asia/Tokyopublic
Asia/Tokyo
2. Review and Approval of Previous Meeting Minutes
3. Liaison Report
3.1 North America TC Chapter
4. Staff Report
5. Technical Committee Award
6. Ballot Review
None
7. Subcommittee & Task Force Reports
7.1 5 Year Review Task Force
7.2 Japan Single Device Traceability (SDT) liaison TF
7.3 Japan Equipment and Materials Traceability (EMT) liaison TF
7.4 Panel Level Packaging (PLP) Glass Carrier ID Marking Task Force
8. Old Business
8.1 5 Year Review Check
8.2 SNARF Project Period Check
9. New Business
9.1 Proposal for Submission of Ballot #6674: New Standard: Specification of ID Marking for Glass Carrier Characteristics of Panel Level Packaging (PLP) Applications
9.2 Simulation of the Official Virtual TC Chapter Meeting (per Procedure Manual ¶4.3.6.2)
10. Action Item Review
10.1 Open Action Items
10.2 New Action Items
11. Next Meeting and Adjournment
1:00 pm - 4:00 pm
Off
Add to Calendar2020-12-24 13:00:002020-12-24 16:00:00Traceability Japan TC Chapter MeetingTraceability Japan TC Chapter Meeting
Date: Thursday, December 24, 2020
Time: 13:00-16:00 [JST]
AGENDA (Tentative)
1. Welcome / Call to Order
1.1 Introductions
1.2 Meeting Reminders (Membership Requirement, Antitrust and Intellectual Property Reminders, Effective Meeting Guidelines)
1.3 Agenda Review
2. Review and Approval of Previous Meeting Minutes
3. Liaison Report
3.1 North America TC Chapter
4. Staff Report
5. Technical Committee Award
6. Ballot Review
None
7. Subcommittee & Task Force Reports
7.1 5 Year Review Task Force
7.2 Japan Single Device Traceability (SDT) liaison TF
7.3 Japan Equipment and Materials Traceability (EMT) liaison TF
7.4 Panel Level Packaging (PLP) Glass Carrier ID Marking Task Force
8. Old Business
8.1 5 Year Review Check
8.2 SNARF Project Period Check
9. New Business
9.1 Proposal for Submission of Ballot #6674: New Standard: Specification of ID Marking for Glass Carrier Characteristics of Panel Level Packaging (PLP) Applications
9.2 Simulation of the Official Virtual TC Chapter Meeting (per Procedure Manual ¶4.3.6.2)
10. Action Item Review
10.1 Open Action Items
10.2 New Action Items
11. Next Meeting and AdjournmentSEMIジャパン 市ヶ谷 1-17 千代田区 九段南, Tokyo 102-0074 JapanSEMI.org[email protected]Asia/Tokyopublic
Asia/Tokyo
Semiconductor Components, Instruments, and Subsystems (SCIS) is a SEMI technology community chartered to address process-critical components challenges to meet the demands of high-volume manufacturing (HVM) at advanced process nodes. SCIS brings together all stakeholders that are driving yield improvements through the very last frontier of component and hardware defect reduction.
Defect prediction and defect source mitigation is critical to enabling high-volume manufacturing at all semiconductor fabs, but especially at advanced process nodes. This program will provide perspectives on:
Importance of OEM part design, cleaning & refurbishment loops for advanced node high volume manufacturing and designing for zero defects
The standards gap between cleanliness specs, measurement methods & successful predictive maintenance (PdM) in the Fab and how to enable AI based maintenance scheduling
Applicability of cleaning techniques vs OEM part designs and mitigating human variability during parts cleaning
The emerging considerations for parts designed to facilitate cleaning
Who Should Attend
IDMs, fabs, foundries; fab managers, process engineers
Semiconductor processing equipment OEMs
Critical chamber component suppliers
Semiconductor processing equipment parts clean vendors
Parts clean metrology service providers
United States
8:00 am
-
8:05 am
Paul Trio
Welcome Remarks & Moderation
Paul Trio, Senior Manager, Strategic Initiatives
SEMI
8:05 am
-
8:40 am
Patrick Martin
OEM Perspective on Parts Cleaning - Cleanliness and Hardware Connectivity
Patrick Martin, Business Development, New Markets and Alliances
Applied Materials
Off
Add to Calendar2021-07-19 00:00:002021-07-22 00:00:00EH&S North America Standards Summer Meetings Ringcentral web and teleconference Online, Pacific Time United StatesSEMI.org[email protected]America/Los_Angelespublic