October 14, 2026 - October 15, 2026
Join us for the Test Vision Symposium in person event taking place on October 13-15 at SEMICON West 2026.
Time
9:00 am - 5:00 pm PDT
Add to Calendar
2026-10-14 09:00:00
2026-10-15 17:00:00
Test Vision Symposium
Join us for the Test Vision Symposium in person event taking place on October 13-15 at SEMICON West 2026. Submit your abstract today!
Moscone Center San Francisco, CA United States
SEMI.org
[email protected]
America/Los_Angeles
public
Location
Moscone Center
San Francisco, CA
United States
Test Vision Symposium at SEMICON West 2026
The Test Vision Symposium at SEMICON West brings together semiconductor test experts and industry visionaries to explore and shape the future of testing. This year’s theme, “Tomorrow’s Test Vision” highlights the collaborative and innovative spirit driving the next wave of advancements in semiconductor testing.
As advancements in AI, advanced packaging, silicon photonics, and high-performance computing accelerate, test strategies must evolve in parallel. Increasing device complexity makes testing essential for reducing time to market, ensuring reliability, controlling costs, optimizing performance, and enabling scalable manufacturing across applications from autonomous vehicles, renewable energy to AI‑powered systems and next-generation consumer electronics.
Test Vision 2026 provides a forum for open dialogue, knowledge sharing, and forward‑looking perspectives on semiconductor testing. This year’s symposium brings the “vision” back into Test Vision—fostering collaboration, partnership, and innovation to enable the next phase of real‑time evolution in test technologies.
We invite abstracts that explore innovative test methodologies, data‑driven approaches, and solutions addressing challenges such as AI enablement, thermal management, and heterogeneous integration.
- Learn more about the Test Vision Award. Last year, the 2024 Best ATE Paper Award was awarded to Best ATE Paper Award recipients at SEMICON West 2025!
- View the Test Vision Committees
The symposium features keynote speakers, panel sessions, poster sessions, and a host of papers focused on industry trends, challenges, and solutions facing the test community. The symposium is co-located at SEMICON West and is held as an in-person event.
If you have questions, please contact the program manager and registration chair - Basak Ulutas Ozturkler from SEMI.
Stay tuned for 2026 Agenda!
Agenda
Wednesday, October 8, 2025
9:00 am
-
12:20 pm
Lauren Getz
Product Manager
Teradyne Somerville
Test Vision: Day 1 - Session 1: Hardware
9:00 am
-
9:10 am
Alan Liao
Director, Probe BU Product Marketing
FormFactor
Welcome Remarks
9:10 am
-
9:20 am
Lauren Getz
Product Manager
Teradyne
Program Overview
9:20 am
-
9:50 am
Paul Berndt
Consultant
NW Test Engineering
Best ATE Paper Award of 2024 Award and Presentation
9:50 am
-
10:50 am
Samer Kabbani
CEO
AEM
Test Vision Keynote
10:50 am
-
11:05 am
KAVIYA RAVI
Signal Integrity Engineer
Advantest
Design Optimization to mitigate Crosstalk for high-speed signals
11:05 am
-
11:20 am
Daniele Varetto
Senior Engineer SPEA S.p.A.
Advanced Test Methodologies for High-Performance ADC and DAC Converters
11:20 am
-
11:35 am
Nupur A. Basak
Sr. Staff Signal Integrity Engineer
Intel
High Bandwidth interposer integrated test socket for System Test
11:35 am
-
11:50 am
Jason Doege
Product Manager
Siemens EDA
High Bandwidth Scan Testing on Limited Interfaces
11:50 am
-
12:05 pm
Navin Subramani
Solutions Architect - Automation & AI
Soliton Technologies Inc
Accelerating Semiconductor Test Development using Generative AI
12:05 pm
-
12:20 pm
Junko Nakaya
Global Marketing Communications
Advantest America
Session 1 Review + Raffle
1:30 pm
-
3:00 pm
Adrian Kwan
Senior Business Development Manager
Advantest America Inc.
Test Vision: Day 1 - Session 2: Test Development
1:30 pm
-
1:45 pm
Ken Lanier, BSEE
Dir of Business Development
Teradyne
The Changing Culture of Test
1:45 pm
-
2:00 pm
Hailin Wang
Application Engineer
ElevATE Semiconductor
Varun Krishnamurthy
Sr. Quality Engineer
ElevATE Semiconductor
Implementing Effective Test Limits for Rapid Root-Cause Analysis in RMA Investigations
2:00 pm
-
2:15 pm
Aishwarya Suresh
HBM Reliability Engineer
Micron Technology Inc
AI-Driven Test Innovation to Improve Reliability in Vertically Integrated Memory Devices
2:15 pm
-
2:30 pm
Preston McWithey
Product Engineer
Siemens EDA
Steve Palosh
Field Applications Engineer
Siemens EDA
Pete Orlando
Product Manager
Siemens EDA
DFT Architecture Enabling Adaptive Test
2:30 pm
-
2:45 pm
Brian Buras
Solution Architect
Advantest
Using AI to Test AI: Accelerating Hill Climbing with Automated Evaluation of RAG-Based LLM Agents
2:45 pm
-
3:00 pm
Robert Schneider
Business Development Manager
Advantest
Session 2 review + Raffle
3:00 pm
-
3:10 pm
Basak Ulutas Ozturkler
SEMI
CAST Update: Metrology & AI Working Group
3:10 pm
-
5:00 pm
Trent Weaver
Product Manager
Teradyne
Rick Marshall
PDF
Test Vision Poster Session and Reception
3:10 pm
-
5:00 pm
Uthrakumar Arumuganainar
Head of Business Solutions
Soliton Technologies
Accelerating Post-Silicon Validation with TestOps: A DevOps-Inspired, AI-Enabled Workflow
3:10 pm
-
5:00 pm
Venkatesh Perumal Pranay Chandragiri
Senior Lead - Technical Solutions
Soliton Technologies Pvt Ltd
Navin Subramani
Solutions Architect - Automation & AI
Soliton Technologies Inc
Addressing the Dynamic Landscape of Post-Silicon Validation with A Standardized Software Framework
3:10 pm
-
5:00 pm
John Byrnes
Sales Manager
Semilab USA LLC
Advanced inspection systems for next-generation photonic materials
3:10 pm
-
5:00 pm
Dushsyant K Rajamohan
Product Manager
Keysight Technologies
Advancing IC Reliability Through Capacitive-Based, Non-Destructive Wire-bond Defect Screening
3:10 pm
-
5:00 pm
Marc Jacobs
Technical Sales & Fabless Prod Mgmt. Advisor
PDF Solutions
Ming Zhang, PhD
VP, Fabless Solutions
PDF Solutions
AI for Test, the New Frontier
3:10 pm
-
5:00 pm
Jaelyn S. Liang
Research Intern
UCSD Health
An FPGA-Based Neuromorphic-Deep Learning Fusion Architecture for Energy Efficient AI Applications
3:10 pm
-
5:00 pm
Bert Woods
ICPMS Applications Chemist
Agilent Technologies
An Innovative Way to Achieve Lowest the Detection Limits in an All Hot Plasma via ICP-MS
3:10 pm
-
5:00 pm
Andy Kittross
AI SW Architect
Teradyne
Artificial Intelligence Agents Boost Engineer Productivity
3:10 pm
-
5:00 pm
Trevor Thornton
Professor of Electrical Engineering
Arizona State University
Ankita Kashyap
Research Assistant
Arizona State University
Automated Testing of Large-Area Diamond Schottky Diode Arrays for Enhanced Manufacturability
3:10 pm
-
5:00 pm
Pouya Tavousi
Dr
University of Connecticut
Correlative Imaging Pipeline for High-Precision and Fast Test Metrology of TSV Arrays
3:10 pm
-
5:00 pm
JERRY BROZ
VP, Business Development & Strategic Marketing Gel-Pak,
a Delphon Industries Company
Victoria Tran, PhD
Director of R&D Gel-Pak,
a Delphon Industries Company
Data Integrity and Device Handling Challenges For Expanded Wafer and Device Testing
3:10 pm
-
5:00 pm
Navin Subramani
Solutions Architect - Automation & AI
Soliton Technologies Inc
Domain Knowledge: The Key Ingredient to Effective and Sustainable Agentic Systems
3:10 pm
-
5:00 pm
YU-HSIEN LIN
Director of Product Marketing
Onto Innovation
Enabling Yield and Reliability in Next-Gen HBM Packaging Thru Laser-Based Glass Carrier Inspection
3:10 pm
-
5:00 pm
Navin Subramani
Solutions Architect - Automation & AI
Soliton Technologies Inc
Domain Knowledge: The Key Ingredient to Effective and Sustainable Agentic Systems
3:10 pm
-
5:00 pm
YU-HSIEN LIN
Director of Product Marketing
Onto Innovation
Enabling Yield and Reliability in Next-Gen HBM Packaging Thru Laser-Based Glass Carrier Inspection
3:10 pm
-
5:00 pm
Rebecca McCordic
Nordson
Enhancing Acoustic Image Analysis Through Machine Learning
3:10 pm
-
5:00 pm
Takumi Kobayashi
HIOKI E.E. CORPORATION
Ivan DeGuzman
HIOKI E.E. CORPORATION
Flying Probe Tester Solution for Advanced Package
3:10 pm
-
5:00 pm
Vidyut Gopal
EMD Electronics
From Lab to Fab: Building the Collaborative R&D Engine for Materials Innovation
3:10 pm
-
5:00 pm
Junzhe Xie
Graduate Research Assistant
Arizona State University
Ziyi He
PhD
Arizona State University
Houqiang Fu
Assistant Professor
Arizaon State University
GaN High Electron Mobility Transistors with Novel Dielectrics and Etching for Power Electronics
3:10 pm
-
5:00 pm
Vineet Pancholi
Manufacturing Test Technologist
Amkor Technology, Inc.
YoungSoo Lee
Sr. Director
Amkor Technology Inc.
High Performance Compute: Advanced Packaging Impacts to Test Equipment
3:10 pm
-
5:00 pm
Treasa S. Hlaing
Senior Executive Program Manager
ElevATE Semiconductor Inc.
High Voltage DUT Power Supply IC for Automotive Grade Testing
3:10 pm
-
5:00 pm
YU-HSIEN LIN
Director of Product Marketing
Onto Innovation
High-Speed Photoluminescence Inspection for Killer Defect Detection/Binning in Power Semi Substrates
3:10 pm
-
5:00 pm
Yashvi Singh
Senior Front End Technology Development
Supplier Development Manager at Micron Technology
High-Temp Characterization of Monolayer MoSe₂ FETs for Extreme Environment Sensors & Electronics
3:10 pm
-
5:00 pm
Edward Nelson
AFM Technical Specialist
Nanosurf / SPEC-TII
Dominik Ziegler
CEO
Nanosurf AG
High-Throughput Wafer Metrology: Roughness and Mechanical Mapping with Alphacen 300
3:10 pm
-
5:00 pm
Diwas Shrestha
Business Development Manager
Advantest Europe GmbH
Michael Kwok
Advantest Europe GmbH
High-Volume Manufacturing Testing for Silicon Photonics and Co-Packaged Optics: Gaps and Solutions
3:10 pm
-
5:00 pm
Mason Lyu
Senior Manager
Chroma ATE Inc.
How Heterogeneous Integration Is Reshaping ATE Requirements
3:10 pm
-
5:00 pm
Anastasiia Makhniaieva
Software Engineer
ElevATE Semiconductor
Improving Productivity in Test Program Management with GitHub Version Control
3:10 pm
-
5:00 pm
Jeffrey hwang
Director
Group / CRD / Corporate Test R&D
In-Process Test Challenges in Hybrid Packaging Assembly
3:10 pm
-
5:00 pm
Brent Bullock
Test Technology Director
Advantest America Inc
Killer problems warrant cross-company data analytics, upon occasion
3:10 pm
-
5:00 pm
Anis Rahman
Chief Technology Officer
Applied Research & Photonics, Inc.
Lattice Damage of GaN and HEMT Investigated by T-Ray Imaging and Deep-level Time-Domain Spectroscopy
3:10 pm
-
5:00 pm
Vidya Vijay
Director,
Business Development
Metrology Sensor Technology Significantly Improving Yields & Processes for Front-End Tools
3:10 pm
-
5:00 pm
Govarthanam Krishnasamy
Manager - Cloud Ventures | Semiconductor Speciality
Soliton Technologies Pvt. Ltd.
Modernizing Post-Silicon Validation Using a GenAI-Based Agentic TestOps Ecosystem
3:10 pm
-
5:00 pm
Laura Rojas
Machine Learning Engineer
Teradyne
Modernizing Post-Silicon Validation Using a GenAI-Based Agentic TestOps Ecosystem
3:10 pm
-
5:00 pm
Pearl He
CEO
Gubo Technologies
Revolutionizing AMS Chip Validation : AI Agent-Assisted Workflow for Validation Engineers
3:10 pm
-
5:00 pm
Rick Wise
Applied Research & Photonics, Inc.
Semiconductor Carrier Concentration and Transition Layer Profiling by T-ray Pump-Probe Interference
3:10 pm
-
5:00 pm
Josh Magnus
Graduate Student
University of Arizona
Khanh Kieu
Professor
University of Arizona
Surface Profilometry of Semiconductor Chips with Third Harmonic Generation Microscopy
3:10 pm
-
5:00 pm
JUYANG WENG, PhD
President
GENISAMA
Min Guo
GENISAMA
Testing AI: A Flood of Post-Selection Misconduct (P-Hacking) and a Holistic Solution
Brent Bullock
Test Technology Director
Advantest America Inc
The Age of Singulated Die Test
Klaus Bergner
CTO
VACOM
Total and Partial Vacuum Measurement: Verification for High-Purity Applications and Guard for Load Locks
3:10 pm
-
5:00 pm
Deepshikha Shekhawat
Business Intelligence Program Manager
Advanced Micro Devices
Neeraj C. Shukla
Data Architect
Deloitte USA
Toward an Autonomous Test Decision Center: A Vision for Context-Aware Engineering Intelligence
3:10 pm
-
5:00 pm
Oytun Tasgit
Business Development Manager
Microdiagnostics 3D-Micromac AG
Ultrafast Laser-Based Sample Preparation: Enhancing FIB/SEM Workflows for High-Throughput Analysis
3:10 pm
-
5:00 pm
Constantinos Xanthopoulos
Senior Data Scientist
Advantest America, Inc.
Upskilling Test Engineers with AI
3:10 pm
-
5:00 pm
Benny Weng
Advantest
Vibe Coding in Practice: Accelerating Semiconductor Test Applications with LLMs
Thursday, October 9, 2025
9:00 am
-
11:45 am
Rich Dumene
Principal Test Architect
Renesas Electronics Corporation
Test Vision: Day 2 - Session 3: Test Analysis
9:00 am
-
10:00 am
Octavio Martínez
Vice President of Engineering
Qualcomm
Qualcomm - Presentation Title TBD
10:00 am
-
10:15 am
Deepshikha Shekhawat
Business Intelligence Program Manager
Advanced Micro Devices
Neeraj C. Shukla
Data Architect
Deloitte USA
Redefining Test Success: A Vision for Dynamic Key Performance Indicators in Semiconductor Operations
10:15 am
-
10:30 am
Fangmin Chu
Senior Consulting Manager
Advantest
Cloud-IoT Integration for Real-Time Data-Driven Optimization in Semiconductor Test
10:30 am
-
10:45 am
yesh Kolla
Vice President, Circuit and Technology
Ampere Computing
Revolutionizing Semiconductor Design and Testing for AI and Cloud-Native Compute
10:45 am
-
11:00 am
Tareq Aljaber
CEO & Founder
Averroes.ai Inc.
Accelerating Visual Test with Accessible AI for High-Accuracy Model Deployment
11:00 am
-
11:30 am
Jin Yu
Head of Machine Learning
Teradyne
Sandeep Kumar Goel
Leveraging ML to Detect Defective Through Silicon Via (TSV) in 3D Integrated Chips (3DICs)
11:30 am
-
11:45 am
Padmanabha Srinivasamurthy
Software Architect
Teradyne
Session 3 Review + Raffle
12:45 pm
-
4:05 pm
Preston McWithey
Product Engineer
Siemens EDA
Test Vision: Day 2 - Session 4: Silicon Photonics
12:45 pm
-
1:30 pm
Ian Mazsa
Vice President of Semiconductor Test
Cohu
Keynote - Cohu
1:30 pm
-
1:45 pm
Dan Rishavy
Strategic Market Development Director
FormFactor
Innovative Testing Strategies for Si Photonic Devices in Engineering and Production Applications
1:45 pm
-
2:00 pm
Ira H. Leventhal
Vice President
Advantest America, Inc.
Transitioning from Copper to Optics: HVM-Scalable Test Solutions for CPO-based HPC Devices
2:00 pm
-
2:15 pm
Vineet Pancholi
Manufacturing Test Technologist
Amkor Technology, Inc.
Manufacturing Test Challenges for Co-Packaged Optics
2:15 pm
-
2:30 pm
Matthew Griffin
Sr. Product Manager
Teradyne
Scaling Photonics Test for the Next Decade: Lessons from Wafer to Co-Packaged Optics
2:30 pm
-
2:45 pm
Akshay Dipakkumar Harlalka
Staff Mechanical Engineer
Atomic Machines Inc.
Advancing Fault Detection for 3D and Heterogeneous Semiconductor Systems
3:00 pm
-
3:15 pm
Basak Ulutas Ozturkler
SEMI
Session 4 review + Raffle
3:15 pm
-
4:00 pm
Gaurav Verma, MS, BTech
Senior Director of Engineering
Qualcomm
Marc Hutner
Director of Product Management
Siemens EDA
Nitza Basoco
Technology and Market Strategist
Teradyne
Sudhakar Raman
SVP and General Manager of Probe BU
FormFactor
Rich Lathrop
VP of Test Technology
Advantest
Panel session: Test Technology in a Collaborative Era: Advancing Standards for Chiplets, Heterogeneous Integration, and System-Level Validation
4:00 pm
-
4:05 pm
Gaurav Verma, MS, BTech
Senior Director of Engineering
Qualcomm
Closing Remarks
Test Vision Symposium is the premier event for semiconductor and system test experts, organized with a vision towards the future of test, to discuss upcoming trends, innovations, and requirements. It gathers an elite group of providers and users of test IP and equipment, to hear and engage with leaders in the field. You'll meet, learn, and network with 100+ participants in the field of test. Held in conjunction with SEMICON West assures access to a wide range of expertise and experience.
Test Vision is made possible due to our corporate sponsors, press partners and other partners mentioned below as well as our team of volunteers in the program committee and steering committee.
Sponsors
2025 Partner Sponsors
2025 Associate Sponsors
2025 Supporter Sponsors
Industry Conference Partner
Interested in becoming a 2026 Test Vision Symposium sponsor? Download the form here.
The Test Vision Symposium (TVS) is proudly brought to you by the Collaborative Alliance for Semiconductor Test (CAST) – CAST develops, coordinates, and directs all SEMI services for the semiconductor test community.
Test Vision Symposium 2024 Photos
