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Test Vision Symposium Best ATE Paper Award

To spotlight advances in ATE TestVision and the Test Technology Technical Council (TTTC) created the Best ATE Paper Award. The purpose of this award is to single out and publicize the most influential ATE paper of the year to stimulate innovation in the ATE industry. The winner is announced at Test Vision at SEMICON West.

2018 Award Finalists

Our finalists for the Best ATE Paper of 2018 are:

  • Innovative Approach to MEMS Contactor, Norihiro Ohta and Pete Rogan, presented at 2018 BiTS
  • Methodology for Measuring and Characterizing 28 Gbps+ SERDES Sockets, Sandeep Sankararaman and Noel Del Rio, presented at 2018 BiTS
  • A Coherent Subsampling Test System Arrangement Suitable for Phase Domain Measurements, Young Gouk Cho, Gordon Roberts, Sadok Aouini, Mahdi Parvizi , Naim Ben-Hamida, presented at 2018 VTS

The Best ATE Paper Award Selection Committee appreciates and relies upon inputs from the technical community when naming the Best ATE Paper.  

Test Vision Symposium at SEMICON West 2019 will be held on July 10-11 at the Moscone Center in San Francisco, California.

The recipient(s) of the Best ATE Paper of 2018 award will be announced at the Test Vision Symposium Day 1 session on July 10, 2019.


2018 Award Recipients for Best ATE Paper of 2017:

Nimit Jain, Nitin Agarwal, Rajavelu Thinakaran and Rubin Parekhji
"Low Cost Dynamic Error Detection in Linearity Testing of SAR ADCs"
Presented at the 2017 International Test Conference; Fort Worth, Texas; October 2017

Past Award Recipients:

Award Selection Committee

  • Benjamin Brown (Chair), Xcerra

  • Dave Armstrong, Advantest

  • Dr. Erik Larsson, Lund University

  • Dieu Van Dinh, NXP

  • Ken Lanier, Teradyne

  • Professor Gordon Roberts, McGill University

  • Michael Peters, Elmos

  • Paul Berndt, Microsoft

The recipient(s) of the Best ATE Paper of 2018 award will be announced at the Test Vision Symposium @ SEMICON West 2019.