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Test Vision Symposium Best ATE Paper Award

To spotlight advances in ATE TestVision and the Test Technology Technical Council (TTTC) created the Best ATE Paper Award. The purpose of this award is to single out and publicize the most influential ATE paper of the year to stimulate innovation in the ATE industry. The winner is announced at Test Vision at SEMICON West.

2019 Award Finalists

Below are the finalists for the Best ATE Paper of 2019:

  • From ITC-Asia: “Accurate and Fast Testing Technique of Operational Amplifier DC Offset Voltage in μV-order by DC-AC Conversion”
    • Authors: Yuto Sasaki ,Kosuke Machida, Riho Aoki, Shogo Katayama, Takayuki Nakatani, Jianlong Wang, Anna Kuwana, Kazumi Hatayama, Haruo Kobayashi from Division of Electronics and Informatics, Faculty of Science and Technology, Gunma University and Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa from ROHM Semiconductor.
  • From SW Test: “5G Wafer Test and the New Age of Parallelism”
    • Authors: Daniel Bock, Ph.D. and Choon Beng Sia, Ph.D. from FormFactor, Inc.
  • From ITC“Effectively Using Machine Learning to Expedite System Level Test Failure Debug” 
    • Authors: Luis D. Rjas, Kevin Hess, and Christina Carter-Brown from Intel Corporation.

The Best ATE Paper Award Selection Committee appreciates and relies upon inputs from the technical community when naming the Best ATE Paper.  

Test Vision Symposium will be held on July 21-23 in conjunction with the SEMICON West 2020 Virtual Event . The recipient(s) of the Best ATE Paper of 2019 award will be announced on the first day of the symposium.


2019 Award Recipients for Best ATE Paper of 2018:

Norihiro Ohta (Nidec-Read) and Pete Rogan (Nidec SV TCL)
"Innovative Approach to MEMS Contactor"
Presented at the 2018 BiTS Workshop; Mesa, Arizona; March 2018

Past Award Recipients:

Award Selection Committee

  • Paul Berndt (Chair), Microsoft

  • Dave Armstrong, Advantest

  • Dr. Erik Larsson, Lund University

  • Dieu Van Dinh, NXP

  • Ken Lanier, Teradyne

  • Professor Gordon Roberts, McGill University

  • Michael Peters, Elmos

The recipient(s) of the Best ATE Paper of 2019 award will be announced at the Test Vision Symposium @ SEMICON West 2020.