Showing 8005 - 8016 of 11445
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ASMC 2020 - Session 13
Session 13—Contamination Free Manufacturing
Chairs: Jennifer Braggin, Entegris; Christopher Ebert, Linde; Christopher Long, IBM Research
Contamination in the form of particulates, surface...
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ASMC 2020 - Session 12
Session 12—Advanced Metal Structures
Chairs: Marc Bergendahl, IBM Research; Goswami, Shubhodeep, GE Global Research; Rob Pearson, Rochester Institute of Technology
This session begins with a...
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ASMC 2020 - Session 11
Session 11—AM 2: Patterning and 3D M II
Chairs: Ronny Haupt, NOVA; Sean Teehan, IBM Research; Padraig Timoney, GLOBALFOUNDRIES
This session is focused on patterning metrology, and the topics...
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ASMC 2020 - Session 10
Session 10—Yield Enhancement
Chairs: Sagar Kekare, KLA; Reshmi Mitra, Samsung Austin Semiconductor; Larry Pulvirent, SkyWater Technology
Yield improvement in today’s fabs requires careful...
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ASMC 2020 - Session 9
Session 9—Smart Manufacturing
Chairs: Eric Eisenbraun, SUNY Polytechnic Institute; Jan Rothe, GLOBALFOUNDRIES; Satyajit Shinde, Samsung Austin Semiconductor
This session focuses on AI, NN and data...
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ASMC 2020 - Session 8
Session 8—Defect Inspection II
Chairs: Shravan Matham, IBM Research; Oliver Patterson, Hermes Micro-Vision; Qintao Zhang, Applied Materials
Inline defect inspection is critical for modern...
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ASMC 2020 - Session 7
Session 7—Factory Optimization
Chairs: Thomas Beeg, Wolfspeed; Jagdish Prasad, Silfex (Lam Research); Stefan Radloff, Intel Corporation
The challenges of current and future semiconductor process...
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ASMC 2020 - Session 6
Session 6—Advanced Process Control
Chairs: John Jensen, Lam Research; Agnes Roussy, École des Mines de Saint-Étienne; Raymond van Roijen, GLOBALFOUNDRIES
APC leverages the data collection...
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ASMC 2020 - Session 5
Session 5—Poster Session
Tuesday, May 5, 2020
5:15-6:45pm
Chairs: Shekhar Bakshi, Analog Devices; Rajan A. Beera, PhD, Pall Microelectronics; Jeanne P. Bickford, PhD; Thanas Budri Texas...
Blog
MEMS-FHE Device Integration Gets Real
MEMS technology has changed human interaction with electronic devices. Introduced in the 1990s, the first mass-market MEMS devices were used for inkjet printheads and automotive airbag crash sensors....
Event
Smart Data WEBINAR: Challenges and Solutions in Superconducting Qubit Fabrication
A SEMI Smart Data Hosted Webinar
Member Company
Beckhoff Automation Co., Ltd.
Beckhoff implements open automation systems using proven PC-based control technology. The main areas that the product range covers are industrial PCs, I/O and fieldbus components, drive technology,...