Showing 7933 - 7944 of 11347
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ASMC 2020 - Session 10
Session 10—Yield Enhancement
Chairs: Sagar Kekare, KLA; Reshmi Mitra, Samsung Austin Semiconductor; Larry Pulvirent, SkyWater Technology
Yield improvement in today’s fabs requires careful...
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ASMC 2020 - Session 9
Session 9—Smart Manufacturing
Chairs: Eric Eisenbraun, SUNY Polytechnic Institute; Jan Rothe, GLOBALFOUNDRIES; Satyajit Shinde, Samsung Austin Semiconductor
This session focuses on AI, NN and data...
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ASMC 2020 - Session 8
Session 8—Defect Inspection II
Chairs: Shravan Matham, IBM Research; Oliver Patterson, Hermes Micro-Vision; Qintao Zhang, Applied Materials
Inline defect inspection is critical for modern...
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ASMC 2020 - Session 7
Session 7—Factory Optimization
Chairs: Thomas Beeg, Wolfspeed; Jagdish Prasad, Silfex (Lam Research); Stefan Radloff, Intel Corporation
The challenges of current and future semiconductor process...
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ASMC 2020 - Session 6
Session 6—Advanced Process Control
Chairs: John Jensen, Lam Research; Agnes Roussy, École des Mines de Saint-Étienne; Raymond van Roijen, GLOBALFOUNDRIES
APC leverages the data collection...
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ASMC 2020 - Session 5
Session 5—Poster Session
Tuesday, May 5, 2020
5:15-6:45pm
Chairs: Shekhar Bakshi, Analog Devices; Rajan A. Beera, PhD, Pall Microelectronics; Jeanne P. Bickford, PhD; Thanas Budri Texas...
Blog
MEMS-FHE Device Integration Gets Real
MEMS technology has changed human interaction with electronic devices. Introduced in the 1990s, the first mass-market MEMS devices were used for inkjet printheads and automotive airbag crash sensors....
Event
Smart Data WEBINAR: Challenges and Solutions in Superconducting Qubit Fabrication
A SEMI Smart Data Hosted Webinar
Member Company
Beckhoff Automation Co., Ltd.
Beckhoff implements open automation systems using proven PC-based control technology. The main areas that the product range covers are industrial PCs, I/O and fieldbus components, drive technology,...
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SEMI Events – Status Updates
Overview
SEMI has always made the health and safety of its event exhibitors and visitors our top priority. We continue to monitor Coronavirus developments, including advisories from the World Health...
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ASMC 2020 - Session 4
Session 4—Advanced Equipment Processes and Materials
Chairs: Thirumalesh Bannuru, Applied Materials; Katie Lutker, TEL; Jean Wynne, IBM Research
This session focuses on the optimization of...
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ASMC 2020 - Session 3
Session 3—Defect Inspection I
Chairs: Alexa Greer, KLA; Israel Ne’eman, Applied Materials; Alex Varghese, IBM Research; Abhishek Vikram, Anchor Semiconductor
The session includes papers on...