Showing 6505 - 6516 of 8233
Page
First Ballot Issued from RITdb Task Force
First Ballot Issued from RITdb Task Force
By Michelle Sun, SEMI
JULY 2021 UPDATE: Document 6518, New Standard: Specification for Rich Interactive Test Database (RITdb), was reviewed and approved...
SEMI Press Release
SEMI Applauds New Legislative Solution to Address Gap in U.S. CHIPS Act Notice of Funding Opportunity
MILPITAS, Calif. ─ June 10, 2024 ─ SEMI, the industry association serving the global semiconductor and electronics design and manufacturing supply chain, today issued the following statement from Joe...
Page
MEMS Gas Sensors Document Out for Ballot
Gas Sensors Document Under the MEMS Standards Committee is Out for Ballot
By Laura Nguyen, SEMI
As with many emerging technologies, miniaturized gas sensor makers today do not conform to specific...
Event
SCIS Part Clean Program
This 2.5 hour webinar is offered OnDemand from the SEMI Library.
Event
Fundamentals of ALD, ALE and Precursors Chemistries (Americas/EU)
Discover how atomic-scale precision is revolutionizing semiconductor manufacturing with Atomic Layer Deposition (ALD) and Etching (ALE). Course topics include ALD foundational concepts, Chemical...
Page
SPCC 2026 Bio Hui Zhou
Selective Surface Modification Using Amine Chemistry for Enhanced Semiconductor Cleaning PerformanceHuntsman is one of the world’s largest producers of amine chemistry with over 20 years of...
Blog
Celebrating SEMI Members Reaching New Milestones in Q3 2022
Each quarter SEMI recognizes the longstanding commitment and support of member companies as they reach a new membership milestone.
Connecting the entire electronics manufacturing and design supply...
Member Press Release
PNI Sensor’s New TargetPoint Tilt-Compensated Compass Module (TCM) Provides Accurate Heading in any Environment
SANTA ROSA, Calif., – February 17, 2021 – PNI Sensor, the world’s foremost expert in precision location, motion tracking, and fusion of sensor systems into real-world applications, today announced...
Page
Newly Published 3DS-IC Guide
By Ilona Schmidt, Corning and Richard Allen, NIST
SEMI recently published a new standard SEMI 3D21, Guide for Describing Glass-Based Material for Use in...