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First Ballot Issued from RITdb Task Force

By Michelle Sun, SEMI

JULY 2021 UPDATE: Document 6518, New Standard: Specification for Rich Interactive Test Database (RITdb), was reviewed and approved at the Automated Test Equipment (ATE) TC Chapter Meeting in June 2021.

In 2007, the first SEMI Standard Test Data Format (STDF) Standard was published. Many vendors in the Automated Test Equipment (ATE) industry have since adopted STDF for storing test result data. Designed by Teradyne, the STDF format addresses the lack of test result data compatibility between test systems. Its main purpose is to store test data results from semiconductor testers and trimmers.

RITdb Image June2021 articleNow, as the semiconductor industry moves towards wider and faster uses of data, there is an increasing need to store, manage and communicate data and events related to test and adjacent processes. In response, the Rich Interactive Test Database (RITdb) Task Force, led by Texas Instruments and Roos Instruments, has created Document 6518, New Standard: Specification for Rich Interactive Test Database (RITdb). With a compact, extensible, and communicable data and event format, this document has been designed to accommodate the advanced data needs required by Smart Manufacturing and Industry 4.0. Its key features include backward capability and real-time monitoring across a network. This allowance of data from multiple producers can then be merged, synchronized, and delivered to consumers by ensuring portability, provenance and security.

The ballot for Document 6518 was issued in April 2021 and will be reviewed by the ATE North America TC Chapter on Tuesday, June 15, 2021.

The RITdb activity originated in the SEMI Collaborative Alliance for Semiconductor Test (CAST) before it was transitioned to the Standards Program. The goal of CAST is to develop, coordinate, and direct all SEMI services for the semiconductor test community.

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Standards Watch
SEMI
www.semi.org
June 3, 2021