Showing 397 - 408 of 11482
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SPCC 2026 Bio - Ka Cheong "Tim" Lau
Use of Silicon-Based Additives and Their Mechanistic Role in Enhancing the Selectivity of Wet Etching Process on Sige over Si/SioABSTACTSelective etching is a critical enabler for nascent advanced...
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SPCC 2026 Abstract & Bio - Juili Parab
Challenges and Benefits of Using 2-in-1 Filtration Solutions for Contamination Control in Semiconductor Deionized Water (Diw) ApplicationsABSTACTUltrapure deionized water (DIW) is essential in...
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SPCC 2026 Bio - Jay Henderson
NMP Free Positive Photo Resist Stripping with E-GRADE® MEOXABSTACTHuntsman is committed to delivering solutions that support a more sustainable future. Our technologies help address critical...
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SPCC 2026 Bio - Huang-Di Lin
Development of Highly Sensitive Detection for Impurities and Nanoparticles in Liquid Chemicals Using Aerosol TechnologyABSTRACTIn semiconductor manufacturing, a wide variety of chemical solutions are...
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SPCC 2026 Bio - Harman Sangha
Atmospheric Plasma–Based Surface Cleaning Solutions for Advanced Electronics ManufacturingABSTRACTSThe continuous scaling and increasing complexity of electronic devices demand advanced surface...
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SPCC 2026 Bio - Greg Heiland
The Critical Role of Pre-Saturated Cleanroom Wipers in Contamination Control for Advanced Semiconductor ManufacturingABSTRACTAs semiconductor feature sizes continue to shrink and yield requirements...
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SPCC 2026 Bio - Emmanuel Anim-Danso
Low Stiction PFR FFKM and Related Test Method ABSTRACTPerfluoroelastomers (FFKMs) are key raw materials for producing seal elements for applications in semiconductor manufacturing. Beside the...
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SPCC 2026 Bio - Douglas Wagner
BIOGRAPHY Mr. Wagner has been in the semiconductor wet processing and chemical wet bench industry since 1981. He joined Modutek in 1987 and has been with the company for over 30 years. He has...
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SPCC 2026 Bio Chong‑Zan Wu
Quantitative Analysis of Damage Depth in Highly Selective Etching and Cleaning Processes for Spacer Nitride PreservationABSTRACTIn advanced device integration, highly selective etching and post-etch...
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SPCC 2026 Bio Chien-Pin Sherman Hsu, PhD
Highly Selective SiOC Etch for Advanced Sub-3nm ApplicationsABSTRACTSilicon Oxycarbide (SiOC) is a hybrid low-k dielectric material which comprises between k-values and robustness. It is widely...
Blog
Navigating EHS Regulatory Challenges in Semiconductor Manufacturing: Insights and Strategies for 2026 and Beyond
The number of regulatory proposals, including restrictions on substances such as per- and polyfluoroalkyl substances (PFAS), that could hinder the semiconductor industry’s ability to continue...
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SPCC 2026 Bio Alexander Perros
Semiconductor Equipment Part Coating Opportunities with Atomic Layer Deposition (ALD)ABSTRACTAs semiconductor architectures evolve toward 3D logic and memory, part coatings must address escalating...