Showing 385 - 396 of 11342
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SPCC 2026 Bio Shogo Onishi
Design of the Buffing Cleaning Solution for Chemical Mechanical Cleaning on Advanced Technology Node As semiconductor device node shrinks below 2nm, killer defect sizes have become smaller,...
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SPCC 2026 Bio Tomoki Nara
Si/SiGe Selective Wet Etchant for BSPDN Application: Maximization of Selectivity in Single Wafer Spin Wet ProcessingWith continued device scaling, performance degradation caused by power delivery...
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SPCC 2026 Bio Ryotaro Maeda
Approaches to Further Enhance Cut AccuracyYield improvement is a critical concern in semiconductor manufacturing and cut accuracy during bevel wet etching has a considerable influence on both yield...
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SPCC 2026 Bio Nawaphorn Kuhakongkiat
Crystallographic Orientation-Dependent on Native Oxide Evolution for Advanced CMOS Surface ControlThere is a great deal of engineering interest in Si(110) wafer as substrate by its current...
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SPCC 2026 Bio Suhas Ketkar
Impact of Supply Chain Conditions on IPA Product QualityThe IRDS roadmap outlines technology requirements for surface contamination control, specifying that isopropyl alcohol (IPA) used in...
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SPCC 2026 Bio Chun-Ren (Jack) Ke
Silicon-Germanium Etchants with Excellent Silicon and Silicon Oxide Compatibility for Advanced Semiconductor DevicesThis presentation highlights recent advances in formulated chemistries for...
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SPCC 2026 Bio Hsin-Yu Hsu
Wet Cleaning Approaches to Remove Post-Etching AlOx Residues in Al/AlOx/Al StacksWet cleaning of Al and AlOx surfaces is essential for advanced surface preparation, particularly when ultrathin AlOx...
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SPCC 2026 Bio Tyler Duncan
Ab Initio Study of Confined HF Etching Mechanism on SiO2Advancements in semiconductor manufacturing has relied heavily upon increasing the density of features in integrated circuits which...
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SPCC 2026 Bio Diane Bijou
High Loading Capacity Solvent Blend for a Safe and Efficient Alternative to NMP and Amine-Based Strippers Introduction:For photolithography processes, a wide variety of photoresists (PR) are...
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SPCC 2026 Bio Ashutosh Bhabhe
BIOGRAPHY
Ashutosh is the co-founder and CEO of 14Si Solutions, offering expertise in contamination control in process liquids and gases for semiconductor...
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SPCC 2026 Bio Moeka Ajiki
Challenges and Solution of Post Ceria CMP CleanCeria particles are widely used in STI CMP processes because they provide higher TEOS removal rate. High TEOS removal rate is due to the Ce-O-Si bond...
Blog
The Thermal and Power Realities of the AI Era
The rapid growth of AI has created a surge in the global energy consumption at a rate never seen before. Today, data centers account for approximately 415 terawatt-hours (TWh) of electricity...