3월 31, 2027 - 4월 1, 2027
Join us for the Test Vision Symposium in person event taking place on March 31 - April 1 at SEMICON West 2027
시간
9:00 오전 - 5:00 오후 PST
위치
Phoenix Convention Center
Phoenix, AZ
미국
Test Vision Symposium at SEMICON West 2027
The Test Vision Symposium at SEMICON West brings together semiconductor test experts and industry visionaries to explore and shape the future of testing. This year’s theme, “Engineering Trust in Silicon” highlights the collaborative and innovative spirit driving the next wave of advancements in semiconductor testing.
Silicon powers AI, autonomy, electrification, connectivity, and critical infrastructure. Test is becoming the foundation of trust across the semiconductor ecosystem. From design validation to production ramp and lifecycle reliability, test proves that complex devices can perform safely, securely, and consistently.
Test Vision Symposium invites abstracts that show how the ecosystem can build greater confidence in silicon- from chiplets and advanced packaging to AI-driven analytics, power and thermal stress, system-level test, security, and resilient manufacturing. We welcome practical, forward-looking submissions across the topic areas below.
TOPIC AREAS
- Test Ecosystem and Supply Chain
- AI-driven capacity and utilization
- Chiplet, advanced-package, and known-good-die readiness
- Critical hardware sourcing and secure data exchange
- Partner readiness across ATE, OSAT, foundry, and fabless teams
- Power, Thermal & Energy-Aware Test
- Co-packaged power and dynamic power test
- Wide bandgap, high-voltage, and isolation test
- BMS, PMIC, IVR, and thermal-aware test
- Energy-efficient test strategies
- Intelligent Test Infrastructure
- Wafer, panel, probe, socket, and interconnect innovation
- Robotic handling, thermal control, and multisite automation
- AI/ML analytics, diagnostics, EDA-to-ATE, and trusted test data
- Adaptive test flows from real-time manufacturing data
- Emerging Devices, Interfaces & Platforms
- High-speed interfaces, die-to-die links, and CXL/UCIe
- Smart sensors, AI vision, photonics, RF/mmWave, and 6G
- Advanced display, HBM, and memory-centric compute test
- Automotive, edge AI, and mission-critical compute platforms
- Next-Generation Test Methods
- On-die agents, system-level test, and silicon co-simulation
- AI-assisted development, post-silicon debug, and portable flows
- In-field telemetry, predictive reliability, and lifecycle monitoring
- Reliability, secure operations, software-defined test, and hardware security
- Learn more about the Test Vision Award. The 2025 Best ATE Paper Award was awarded to Best ATE Paper Award recipients at SEMICON West 2026!
- View the Test Vision Committees
The symposium features keynote speakers, panel sessions, poster sessions, and a host of papers focused on industry trends, challenges, and solutions facing the test community. The symposium is co-located at SEMICON West and is held as an in-person event.
If you have questions, please contact the program manager and registration chair - Basak Ulutas Ozturkler from SEMI.
Test Vision Symposium is the premier event for semiconductor and system test experts, organized with a vision towards the future of test, to discuss upcoming trends, innovations, and requirements. It gathers an elite group of providers and users of test IP and equipment, to hear and engage with leaders in the field. You'll meet, learn, and network with 100+ participants in the field of test. Held in conjunction with SEMICON West assures access to a wide range of expertise and experience.
Test Vision is made possible due to our corporate sponsors, press partners and other partners mentioned below as well as our team of volunteers in the program committee and steering committee.
후원
Interested in becoming a 2027 Test Vision Symposium sponsor? Download the form here.
The Test Vision Symposium (TVS) is proudly brought to you by the Collaborative Alliance for Semiconductor Test (CAST) – CAST develops, coordinates, and directs all SEMI services for the semiconductor test community.