July 21, 2020 - July 23, 2020
Test Vision 2020 is now the
TEST VISION SYMPOSIUM!
Join us for the Test Vision Symposium virtual event taking place on July 21-23 at SEMICON West 2020.
See the Test Vision Symposium agenda on the SEMICON West website. Search for Test.
The Test Vision Symposium is today's premier event for semiconductor and system test experts. It is organized with a vision towards the future of test, to discuss coming trends, innovations, and requirements.
The symposium features keynote speakers, panel sessions, poster sessions, and a host of papers focused on industry trends, challenges, and solutions facing the test community. The symposium is co-located at SEMICON West and will be held as a virtual event.
If you have questions, please contact the program manager and registration chair, Paul Trio, SEMI.
Tuesday, July 21, 2020: 5G Test Strategies Session LIVE
Session Moderators: Derek Floyd (Advantest), Paul Berndt (Microsoft)
Best ATE Paper Award
To be announced at SEMICON West
RF Test Strategies and Solutions for 5G Millimeter Wave Devices
Speaker: Jeorge S. Hurtarte (Teradyne)
Wednesday, July 22, 2020: 5G OTA Session LIVE
Session Moderator: Rick Marshall (Smiths Interconnect)
5G NR Semiconductor Test Challenges
Speaker: Adrian Kwan (Advantest)
Optimization of 5G OTA Antenna Production Test Interfaces
Speaker: Dylan Feng (Cohu)
Thursday, July 23, 2020: Automotive/Industry 4.0 Session LIVE
Session Moderator: John Shelley (Cohu)
Unique Solution to Probe Constraints for High Current Limit Testing at Probe
Speaker: Alex Saenz (Texas Instruments)
Test Cell Management for Enabling Smart Manufacturing
Speaker: ZhiJun Xue (Advantest)
Tuesday, July 21, 2020 through Thursday, July 23, 2020
Poster Session & Networking Event
• Separate "room" from Live sessions & on-demand library
• Poster talks will be pre-recorded
• Poster presenters will be available to chat in the networking room
1. "Optimization Techniques for C-Bit Utilization on the ETS-364"
Presenter: Alex Saenz (Texas Instruments)
2. Democratizing deep learning to accelerate image based defect inspection"
Presenters: Sindhu Ramachandran (QuEST), Gina Mathew (QuEST)
3. Novel Airborne-based particle measurement methodologies"
Presenter: Yitzhak Vanek (Persys Group)
On Demand Presentations
• "Phase contrast X-ray micro-CT for non destructive imaging of LEDs"
Speaker: Karim S. Karim (KA Imaging)
• "Advanced Sub-surface Inspection Strategies for Advanced Packaging
Speaker: Scott Jewler (SVXR)
• "Laser based 3D-magnetic field sensor formation"
Speaker: Hans-Ulrich Zuehlke (3D-Micromac AG)
• "Smart Factory for Inspection in the Semiconductor Industry"
Speaker: Ragnar Vaga (YXLON)
Test Vision Symposium is the premier event for semiconductor and system test experts, organized with a vision towards the future of test, to discuss upcoming trends, innovations, and requirements. It gathers an elite group of providers and users of test IP and equipment, to hear and engage with leaders in the field. You'll meet, learn, and network with 100+ participants in the field of test. Held in conjunction with SEMICON West assures access to a wide range of expertise and experience.