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The pandemic unleashed by the coronavirus SARS-CoV-2 (which causes the disease COVID-19) has infected over 100 million and resulted in over 2.6 million deaths worldwide as of March 2021. It is well-established that this virus primarily spreads from person-to-person via respiratory droplets produced when an infected person coughs, sneezes or even breathes (see Ref. 1-3). Subsequently, the droplets meet the eyes, or enter nose or mouth of a nearby person, or transmit when a person touches an infected surface, then contacts their eyes, nose, or mouth. Since the virus is small, 0.06–0.14 microns in diameter, many copies can be contained in or attached to emitted respiratory droplets. Droplets as small as one micron can carry enough viral load to cause an infection. A particular concern is the interaction of droplets with ventilation systems, which potentially could enhance the propagation of pathogens. This has implications on situation-specific safe distancing and the design of building filtration systems, air distribution, heating, air-conditioning and decontamination systems. A particular instance of this is the semiconductor manufacturing cleanroom, where systems and protocols are specifically designed to minimize contamination. The $440 billion global semiconductor industry depends on these cleanrooms for integrated circuits (chips), and in turn, these chips form the lifeblood of the multi-trillion-dollar global electronic systems industry. Electronic systems are now critical for just about every aspect of human life, including health, work, finances, entertainment, transportation, power grids and many others. Thus, it is critical to understand how cleanrooms can operate more safely to ensure the health of workers while maintaining productivity levels to meet increasing global demand for semiconductors. In the work described here, we analyzed particle and droplet transport via modeling, simulation [Refs 1-3], and experimentation [Ref. 4] to help guide the industry. Modeling and Simulation In this part of the work, mathematical models were developed to simulate the progressive time-evolution of the distribution of locations of particles produced by a cough. Analytical and numerical studies were undertaken. The models ascertain the range, distribution and settling time of the particles under the influence of gravity and drag from the surrounding air. Beyond qualitative trends that illustrate that large particles travel far and settle quickly – versus small particles that do not travel far and settle slowly (yet can be carried far by ambient flow) – the models provide quantitative results for distances travelled and settling times, which are needed for constructing social distancing policies and workplace protocols. Figure 1 shows examples of the results of the modeling and simulation work. Figure 1: Model of particle spreading from a person coughing, with and without a mask. (Ref. 1) Following are key insights from the modeling and simulation work (Ref. 1): Large particles travel far (launched “ballistically”) and settle quickly, while small particles do not travel far and settle slowly (when there are no ambient externally-driven flow fields). Small particles do not settle even by the end of the simulation time (4 seconds in Ref. 1). Accordingly, the simulations were also run for extremely long periods to ascertain that the “mist” of small particles remained airborne for several minutes (as predicted by the theory). For strong opposing headwind, small particles move backwards, yet still remain airborne for extended periods of time. This is by far the most dangerous case since this will encounter other persons at the torso level. Ratio of the general drag to gravity indicates that at high velocities, the dynamics are dominated by drag. For general cough conditions, there can be cases where the change in the surrounding fluid’s behavior, due to the motion of the particles and cough, may be important. One major implication of this work is that the challenge of infection must be addressed both spatially and temporally. In other words, it is necessary to maintain social distancing based on how far the virus travels, but it is also important to account for how long the virus stays at the location because of specific air patterns. On the positive side, understanding these spatio-temporal patterns accurately will enable companies to design (or re-design) ventilation and decontamination systems precisely to improve worker safety. Other aspects of this analysis entail contact tracing (Ref. 2) and decontamination (Ref. 3). Further details, including simulations, are available at https://msol.berkeley.edu/publications/. Experimentation The major vector of coronavirus spread is through respiratory droplets expelled when coughing, speaking, and breathing; and the efficacy of any safety measures depends on accurate characterization of the dispersal of these droplets. The term particle describes objects that begin their journey as a solid. The term droplet is reserved specifically for objects that are initially liquid, albeit it is important to note that droplets can evaporate and effectively transform into solid particles composed of non-evaporative material. A purpose-built room, the Cal Covid Cube, C3, was set up and utilized for this research [Thatcher et al. 4]. The C3 is a parallelepiped room that is 232 centimeters tall, 376 centimeters long and 284 centimeters wide on the inside. For experimental results to be meaningful and repeatable for scientific and practical purposes, it is essential that the experimental setup be carefully controlled and calibrated. The following precautions were taken to ensure this: Charge-free: When solid particles are released, it is critical to eliminate (or thoroughly know) static charge effects for obtaining accurate deposition patterns. Static charge effects can manifest through particle-particle interactions (affecting particle motion in flight) or particle-surface interaction (affecting deposition pattern). Two methods for the elimination of charge effects on the deposition surface were found to be effective: (1) ionized non-conductive adhesive sampling strips, and (2) grounded aluminum backed carbon sampling strips. Isothermal: The room is a converted walk-in freezer with 10.5-13 centimeter thermal insulation and located in the middle of a building, at least 5 meters away from all building walls. Temperature uniformity was checked and the C3 room temperatures were found to be isothermal within uncertainty of measurements. Quiescent: It was ensured that the room did not create uncontrolled thermal convection due to isothermal nature. Quiescence was verified with both hot-wire measurements and with free-falling particle drift observations. Isopotential: The outer and inner surfaces, including the door of the C3 were conductive aluminum and stainless steel, and copper tape were used to ensure reliable electrical connection of door, interior and exterior panels. Electric fields were surveyed and found to be negligible within precision of instruments. Other design elements: All interior surfaces were coated with black matte paint to reduce scattered light and provide uniform background for imaging measurements. The facility was located on ground floor to limit vibrations. Repeatable Launch: To emulate the release from a true cough or sneeze, and to better understand droplet motion in a canonical turbulent jet versus a cough type release, we studied different layers of complexity for the release geometry: (i) Straight round pipe (ii) Smooth 90-degree curved pipe, with a changing radius along the length of the pipe (iii) Intubation trainer doll, with realistic airways and mouth/tongue structure Figure 2 shows the experimental setup with the intubation doll in C3, with the particle/droplet release being measured after deposition on the sampling strips that appear green. Figure 2: Experimental Setup in C3 with both charge neutralized (white appearing green) and conductive (black) sampling strips placed on a conductive and grounded alignment grid [Ref. 4] We utilized both liquid droplets and solid particles. For droplets, we explored and found promise in a method of deposition analysis based on fluorescence. For particles, we explored many ways in which the smallest of thermal gradients or electrostatic charge issues can affect the data and developed practical methods to address these issues. For accurate measurement free of static charge effects even in environments where high ambient flow velocities may cause a nonconductive surface to rapidly acquire charge (e.g., clean room environment), we developed carbon-tape-based sampling strips that are cleanroom-compatible, conductive, and grounded. For analysis, we developed a cost-effective method utilizing a commercial photo negative scanner followed by image enhancement by blind deconvolution. Figure 3 shows sample results for particle deposition location along our centerline for particles in the ballistic, intermediate and aerosol regime. Figure 3: Experimental Results [Thatcher et al. 4] Following are key insights from experimental work: Significance of both static charge effects and thermal gradients in rooms for validation tests are more than usually appreciated. For modelling, accounting for the non-uniform initial particle velocity matters for the ballistic particles. For all sizes of particles, simulating the transient versus steady state significantly impacts predicted particle spread. Thermal plumes alone from humans along particle flight path can transport 50 micron particles across the room. In some situations, this was observed up to ~6 meters. There is a significant effect of Relative Humidity (RH) and temperature on droplet evaporation. The practical consequence is that, in low RH, particles spread further, with all other things being equal. (The reason is that particles shrunk more and entered the aerosol regime.) In summary, a systematic analysis of particle and droplet transport was conducted by simulation, modeling, and experimentation. We were able to develop robust, rigorous, and repeatable methodologies and draw meaningful insights that will support safer operation and productivity of semiconductor cleanrooms globally. Further, these studies will help with the design (or re-design) of ventilation and de-contamination systems that help protect both the health of humans and the economy from current and future pandemics. This article provides a high-level overview of the work, and further details will be available through a series of scientific papers that are in various phases of publication. We gratefully acknowledge the following support: Gift of the Lam Research Corporation Gifts coordinated through SEMI and provided by Advanced Energy Industries, Applied Materials, ASM, Entegris, JSR, KLA, TEL, and Wonik The 2020 Seed Fund Award from the Center for Information Technology Research in the Interest of Society (CITRIS) and the Banatao Institute at the University of California Vision Research for providing a v2640 camera to help quantify the particle velocities Graduate students Eric Thacher and Tvetene Carlson who conducted the experiments in C3 Valuable discussions with Brett Singer, Thomas Kirchstetter, Michael Sohn, Chelsea Preble of Lawrence Berkeley National Laboratory regarding droplet transport and COVID, and Keith Hansen on particle sampling and charge neutralization DOE Office of Science through the National Virtual Biotechnology Laboratory, a consortium of DOE national laboratories focused on response to COVID-19, with funding provided by the Coronavirus CARES Act Steven Ruzin and the Biological Imaging Facility for their assistance in obtaining the high-quality fluorescence microscopy scans to validate the particle counting methodology. References Zohdi, T.I. (2020) Modeling and simulation of the infection zone from a cough, Computational Mechanics. https://doi.org/10.1007/s00466-020-01875-5 Zohdi, T.I. (2020). An agent-based computational framework for simulation of global pandemic and social response on planet X, Computational Mechanics. https://doi.org/10.1007/s00466-020-01886-2 Zohdi, T.I. (2020) Rapid simulation of viral decontamination efficacy with UV irradiation. Computer Methods Appl. Mech. Eng. https://doi.org/10.1016/j.cma.2020.113216 Thatcher, E., Carlson, J., Castellini, J., Sohn, M.D., Variano, E. and Makiharju S.A. (2021) Droplet and Particle Methods to Investigate Turbulent Particle Laden Jets (in preparation) Authors Evan A. Variano, Professor, Environmental Engineering, UC Berkeley Simo Mäkiharju, Assistant Professor of Mechanical Engineering, UC Berkeley Tarek I. Zohdi, Will C. Hall Endowed Chair of the UCB Computational Data Science Engineering Program, Professor of Mechanical Engineering, UC Berkeley Pushkar P. Apte, Director of Strategic Initiatives, Center for Information Technology Research in the Interest of Society (CITRIS) and the Banatao Institute, UC Berkeley; and Strategic Technology Advisor, SEMI
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If you think the world is flooded with a mind-boggling volume of digital content, then you might be just a amazed to learn about the sheer wealth of information and business opportunities that will be uncovered at this year’s SEMICON Japan as the event goes full digital.To start, more than 160 companies will exhibit their semiconductor manufacturing gear and services on the virtual show floor of Japan’s premier event for the semiconductor manufacturing and design supply chain. Add to that over 80 presentations and panels that feature global industry executives, visionaries and experts offering insights into the latest microelectronics developments, trends and technologies, and it’s easy to see how SEMICON Japan 2020 Virtual is designed to help attendees grow their businesses and the industry drive the next wave of innovations that promise to address some of the world’s greatest challenges across healthcare, the environment, transportation and other industries.Best of all, it will all be available at your convenience from your office or home 24 hours a day, making it safe and easy for you and others from all over the world to attend. Following is what’s in store at SEMICON Japan 2020 Virtual to help lead you into the future.Leading Japanese Securities Analysts to Weigh in What’s Ahead for the Chip Equipment Sector in 2021 For the first time, SEMICON Japan will feature Bulls Bears as Japan’s’ five top securities analysts focus on the 2021 outlook for the global semiconductor equipment sector. The December 17th event will include discussions on the COVID-19 pandemic’s impact on the semiconductor industry, the continuing geopolitical tensions that are forcing the industry to reconfigure its supply chains, the fast-growing China market and cutting-edge applications that are powering industry growth. The perspectives from Japan’s investment community are sure to be compelling as the region supplies one-third of the global semiconductor industry’s chip manufacturing equipment.Moderated by Akira Minamikawa of OMDIA, the panel will include these experts:Three Visionaries to Explore the Digital TransformationPowered by semiconductors, the fourth industrial revolution is driving digitalization globally, remaking societies to bring more efficiencies and conveniences to our work and home lives and help more people prosper. But the flip side of those tremendous benefits is the risk that wealth will be concentrated in the hands of people in positions of power, companies and nations. Democratizing economic development remains a serious challenge worldwide.Addressing this pressing issue, the Opening Panel on December 11 will feature prominent visionaries from political, academic and industrial communities including the following:Sony’s Leading-Edge Electric Car and Nissan’s Driver Assistance System to Highlight Automotive InnovationsCars are becoming more like smartphones on wheels, rapidly filling with more and more semiconductor chips every year with electrification and electronic driver-assisted systems to key drivers of this growth. At the SMART Mobility 1 session on December 14, two pioneering companies – Sony and Nissan Motor – will focus on both areas of semiconductor innovation.Sony’s Vision-S concept car, exhibited at CES 2020, astonished many in the electronics ecosystem and the automotive industry. What is Sony’s vision behind the vehicle? Izumi Kawanishi, Senior Vice President, AI Robotics Business at Sony will share the latest on the initiative.Nissan, maker of the pioneering LEAF electric vehicle, is the first Japanese carmaker to equip a car – its new Skyline – with the ProPILOT 2.0 driver assistance system for hands-off highway driving. Nissan Executive Vice President Asako Hoshino will provide an update on the company’s driver assistance system strategy and plans.Quantum Computing Meets Chip Manufacturing for the First Time at SEMICON Japan In contrast with current computer systems that use bits (binary 0 or 1 state) for computing, quantum computers leverage quantum superposition (0 and 1 states exist at once) to quickly solve highly complex problems that might take traditional supercomputers hundreds or even thousands of years to tease out. American physicist Richard Feynman promoted quantum computer as early as 1982, but it wasn’t until nearly two decades later and long after his death that quantum bit circuits emerged for use in superconductive materials.With quantum circuits and devices requiring state-of-art semiconductor processing technology, The Era of Quantum session on December 15 at SEMICON Japan 2020 Virtual will discuss necessary advances in chip manufacturing technology to enable the next generation quantum computing. The session will be the first time SEMICON Japan connects the semiconductor manufacturing and quantum computing communities.The program will feature the following experts:Strategies for Sustainable Semiconductor Industry GrowthSemiconductors are giving rise to a hyper-connected world that is fueling demand for staggering volumes of chips, pressuring the electronics industry to uncover new ways to increase manufacturing efficiency while reducing power consumption in a bid to help combat climate change. The Grand Finale Panel composed of executives from Japan’s semiconductor supply chain and a supervising ministry will gather for the Grand Finale Panel on December 18 to discuss ways the industry can achieve sustainable growth through innovation with a focus on energy savings and an new process technologies such as extreme ultraviolet lithography (EUV), which promises to enable electronics devices that are more power powerful, cheaper and more energy-efficient.Panelists include the following:Register TodayThe SEMICON Japan 2020 Virtual All-In Pass provides online access to all 80 presentations and panels, which will be available on-demand for replay until January 15, 2021. What’s more, all eight keynote programs will feature English subtitles. For complete information of the exposition, programs and registration, visit the SEMICON Japan website.I look forward to seeing you virtually at the event!Jim Hamajima is president of SEMI Japan.
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New metrology and inspection technologies and new analysis approaches made possible by improving compute technology offer solutions to finding the increasingly subtle variations in materials and subsystems that meet specifications but still cause defects on the wafer. More collaboration across the supply chain is helping too. SEMICON West programs on materials and subsystems will address these issues. New metrology approaches needed to deal with process margin challenges As device process margins shrink and subtler materials variations cause unwanted deviations, the need for better monitoring of both surface and sub-surface material variations is driving a trend towards “metro-spection” – the convergence of metrology and inspection. “Device process margins have eroded to the point that traditional metrology strategies and techniques are no longer viable for controlling yield and parametric performance,” says Nanometrics Vice President Robert Fiordalice, who will speak in the materials program at SEMICON West. “Limited sampling capability, low throughput, insufficient sensitivity or the destructive nature of the techniques can often become problems. What’s more, deviations in material characteristics are not always determined by the initial quality of the material, but often arise from variations during the integration of the materials.” One new type of inline tool or line monitoring technology is Fourier Transform Infrared (FTIR) spectroscopy, traditionally used in quality control or tool characterization. Better sensitivity and higher throughput now enable rapid analysis and feedback for on-the-fly detection of subtle deviations in film properties that may compromise device performance or yield. More advanced analytics will help extract new information from old metrologyMore expensive metrology may not be required to identify subtle variations in in-spec materials that cause wafer defects. Today’s advanced compute capabilities now enable more sophisticated analysis of existing data and the identification of small but significant variations in raw materials and finished goods. The figure of merit (FoM) values presented in certificate of analysis (CoA) reports miss subtle variations in raw material properties. Of particular note is the reduction of molecular weight distributions to a mean, and standard deviation, whereas variations in the tails are associated with pattern defects. Advanced compute capabilities now allow the industry to step beyond the FoM in favor of more holistic measures, enabling predictive analysis of resist chemical variations associated with specific pattern defects. Source: JSR Micro“We often don’t need to find a new measure, but just a new way of looking at what we measure now,” says Jim Mulready, vice president of global quality assurance at JSR Micro. Mulready will speak in the SEMICON West program on materials defectivity issues. “The certificate of analysis reduces multiple measurements to a single figure of merit. But if we ignore all that raw data, we miss a chance to learn. One of our sayings in quality is ‘Customers don’t feel the average, they feel the variation.’ In many electronic materials, the quality of the raw material can have a big impact on the final performance, but the types of analysis needed to look at the tails of the distribution of these measures (such as molecular weight) in detail used to be really hard to do. Now it’s becoming increasingly straightforward and affordable.” Mulready says tools now available in the data processing sector enable the identification of subtle variations in materials that can cause defects on the wafer. These tools use methods like detailed subtractions of chromatography curves of polymer raw materials or analysis of tails of distributions of molecular weights. “Our job now is to drive these kinds of more sophisticated data analysis back into our chemical supply chain as well,” says Mulready. “We must work more closely with our suppliers to integrate their raw materials into our products. The reason the JSRs of the world exist is as a safety valve to reduce the variation from the chemical industry before it gets to the fab.”Continued collaboration with equipment suppliers required While the industry has been talking about the need for tighter collaboration between materials suppliers and equipment manufacturers for years, it still doesn’t always happen. “The material supplier and the equipment maker are tied together like kids in a three-legged race when we deliver an integrated system for consistent on-wafer performance,” says Cristina Chu, TEL/NEXX director of strategic business development, another speaker in the materials program. “When we introduce changes to the tool hardware, we need to make sure it doesn’t upset the system. Similarly, we need the material supplier to send a bottle over when a new chemistry formulation is under development. If a new chemistry runs into problems in the field, it will take much more time for both of us to fix it at the customer site. The toolmaker can provide a slightly different perspective on applications, while being more objective than a customer on how the formulation performs compared to earlier versions.”Regular and ongoing collaboration between chemistry suppliers and toolmakers enables the highest quality system solution to reach the customer. Chu notes that her team tries to maintain consistent collaborations with material suppliers across changes in organizations as the business environment changes. “For consistent on-wafer capabilities, we need a consistent collaboration process with chemistry suppliers. We need to meet with materials providers at a regular cadence throughout their development process. We need to check back with them as we scale up results from the coupon to the wafer level and to work out the kinks in the integrated solution together. The quality and consistency of our combined performance at the customer depends on ensuring the quality and consistency of our development and evaluation process as well.”Fabs and subsystems suppliers look to pilot data sharing program to improve process margins With ever tighter process margins, subtle variations in parameters that don’t appear in the specifications are also compromising results on the wafer, and neither the fab nor the supplier alone has the full information needed to improve performance. To help, a SEMI standards group is developing a protocol for a pilot program to standardize and automate some data sharing.The fab knows that performance is best with a particular parameter value, and knows when performance fluctuates, but often faces a black box problem with no way of knowing what exactly is wrong. In the rush to get the tool back up, the fab engineers may not get around to emailing the supplier about the issue for some time. The subsystems supplier, on the other hand, may know the cause of the variation, but likely has no way of knowing the critical parameters or ideal target values for the fab’s process. “In order for engineers to have constructive conversations about how to improve performance, we all need to exchange more information,” says Eric Bruce, Samsung Austin diffusion engineer, and co-chair of the SEMI Standards initiative addressing the issue, who will speak in the subsystems program at SEMICON West. A potential solution could be to create a standard and automated process to share particular data, agreed to in the purchasing contract, whereby the subsystems supplier shares more information about their parameters with the fab, and the fab in return gives feedback on what parameters work best to drive improved performance. The best place to start will likely be on parts that do not contain core yield-related IP, but where usage and lifetime information is useful.“We’re looking for people to participate in a pilot program to work together with suppliers to try sharing some information to improve performance,” says Bruce. “There’s a lot of this sharing in the backroom anyway, but this could make it fast and automated, and make everyone’s engineering job a lot easier.”Paula Doe, SEMI
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