Cimetrix

This article is the fifth and final in a series highlighting the vital importance of SEMI Standards to commemorate the publication of the 1000th SEMI Standard in July 2019. Find the entire series here.As we define industry standards for managing data in the fab and beyond, we are creating a virtuous circle. More data create better processes. Better processes generate more good data, and more good data lead to better processes. It becomes a cycle of continuous improvement, and we are only just beginning to realize its potential. To dive deeper we interviewed Alan Weber, vice president, New Product Innovations at Cimetrix, and an active member of SEMI Standards Information and Control Committee (IC C).“Industry standards are critical in allowing us to collect information across the fab and use it in increasingly sophisticated control algorithms for the equipment,” said Weber. “The last few years have been about analysis applications that leverage big data in the fab. What started at the lot level is now applied at the wafer level, and for a process like lithography, it’s down to the shot or die level. We’re now collecting enough data variables at individual process and recipe steps to model for predictive maintenance and virtual metrology.”The migration from using data as rearview mirror for identifying and addressing fab issues to using data to head off issues preemptively represents a paradigm shift with immense advantages. This is the starting point for realizing a virtuous data circle.The benefits of a virtuous data circle are simple and compelling: higher yields, faster time to market, more revenue and greater profitability. Our optimism, however, is tempered by major obstacles to this promising future.Multilingual ManufacturingWeber points out that the electronics industry is becoming a multilingual standards world with more than 1,000 fab equipment vendors and several layers of protocols that present the challenge of seamlessly handling multiple protocols. His IC C Committee is out to tackle this challenge.“While SEMI Standards efforts first began in the front end, our standards program now encompasses the back end with test and packaging as well as other device areas including MEMS, sensors and displays,” said James Amano, senior director, International Standards and EHS, SEMI. “We’re going to see data connectivity from the front end to the back end to the final assembly of multi-chip products and that needs standards,” Weber explained. “We’ll need more connected equipment throughout the global, multi-site manufacturing process if we are to support the full traceability requirements of the most demanding markets such as automotive.”The industry will benefit from greater collaboration. Weber predicts that companies will team to create integrated supply chains within broader industry supply chains.Getting the Right People at the Right Time“As we lead the development cycle of a standard from concept to realization, one of the most important jobs of our standards task forces and committees is to coordinate competing companies and build an industry consensus,” Amano said. “This is the case for data in particular, where we rely on industry professionals like Weber and his colleagues, who are working to bring people together to collaborate on developing standards for connectivity and data sharing. It is that critical human element that allows SEMI to sustain our commitment to introducing standards that move the industry forward.”Will Companies Share Data If It Is Secure? Weber contends that when it comes to securing and sharing the data, the biggest challenge is to change the industry’s information-sharing culture.“Finance and defense are already finding ways to deal with data security,” said Weber. “While we will always have problems that require technology fixes, like dealing with new types of computer viruses, I am confident that we will be able to create standards that enable the free, secure flow of information. The key to making progress and better leveraging data is to get companies to see the potential of sharing data while investing in the standards.”SEMI recently launched a project to optimize data sharing across two critical process steps – lithography and plasma etch – to accelerate the adoption of data-driven AI methodologies. The results will help to establish data transfer and management standards crucial to the trusted exchange of trade secrets, IP and other sensitive information. Tools and materials from several SEMI members will be used for the project at Cornell University’s NanoScale Science Technology Facility (CNF). SEMI members are invited to join the project review team. Contact Pushkar Apte at SEMI ([email protected]) for more information on the initiative.Advantages Are Too Great to IgnoreTraditional cultural obstacles aside, the advantages of creating virtuous data circles are simply too great to ignore. Now that it’s accepted wisdom for fabs, factories and supply chains to continuously leverage interconnected data to get smarter, the time has come to extend those advantages throughout the full manufacturing process. Without these data circles, we’ll slow the development of new technologies and applications.We can only speculate where the lines of sharing data are drawn and will be redrawn in the future. But, without doubt, technology innovations such as AI will spawn new information business models that vertically and horizontally integrate companies in ways previously unimaginable. Data standards will underpin this structural transformation.Use your voice to affect standardization in and around the microelectronics industry. Learn about SEMI International Standards – and become part of the solution. Heidi Hoffman is senior director of technology communities marketing at SEMI. Hoffman and her team shine a spotlight on the work of the more than 20 technology communities under the SEMI electronics manufacturing supply chain collaboration platform. Actively engaging community members in marketing programs that showcase their unique value, Hoffman’s team helps companies to grow and prosper through the power of connection, collaboration and innovation.

Even for someone who has been in this industry since the days of the TI Datamath 4-function calculator and the TMS1100 4-bit microcontroller (yes, that’s been a LONG time – the movie Grease premiered the same year!), it is sometimes hard to grasp the scope and complexity of what happens in today’s leading-edge semiconductor gigafabs. In fact, the only way to comprehend the enormous volume of transactions that occur is to consider what happens in a single minute – this is illustrated in the infographic we have labeled “The Gigafab Minute.”* It’s amazing enough to think that a single factory can start 100,000 wafers every month on their cyclical journey through 1500 process steps… and have 99%+ of them emerge 4 months later to be delivered to packaging houses and then on to waiting customers. It’s quite another to realize that all of this happens continuously (24 x 7) and automatically. “How is this possible?” you ask.Well, a big part of the solution is the body of SEMI standards which have evolved since the early 80s to keep pace with the ever-changing demands of the industry. From an automation standpoint, many of these standards deal with the communications between manufacturing equipment and the factory information and control systems that are essential for managing these complex, hyper-competitive global enterprises.A significant characteristic of these standards is that they have been carefully designed to be “additive.” This means that new generations of SEMI’s communications standards do not supplant or obsolete the previous generations, but rather provide new capabilities in an incremental fashion. To appreciate the importance of this in actual practice, consider how the GEM, GEM300, and EDA/Interface A standards support the transactions that occur in a single Gigafab Minute.Starting at 1:00 o’clock on the infographic and moving clockwise, you first notice that 2.31 wafers enter the line. Of course, these are actually released in 25-wafer 300mm FOUPs (Front-Opening Unified Pod), but 100K wafers per month translates to 2.31 per minute. Since these factories run continuously, once the line is full, it stays full. And with an average total cycle time of 4 months, this means that there are 400K wafers of WIP (work in process) in he factory at any given time. This number, and the total number of equipment (5000+), drive the rest of the calculations.GEM (Generic Equipment Model) – SEMI E30, etc.The GEM messaging standards were initially defined in the early 90s to support the factory scheduling and dispatching applications that decide what lots should go to what equipment, the automated material handling systems that deliver and pick-up material to/from the equipment accordingly, the recipe management systems that ensure each process step is executed properly, and the MES (Manufacturing Execution System) transactions that maintain the fidelity of the factory system’s “digital twin.”Every minute of every day, GEM messages support and chronicle the following activities: 240 process steps are completed (i.e., 240 25-wafer lots are processed), 300 recipes are downloaded along with a set of run-specific adjustable control parameters, and 600 FOUPs are moved from one place to another (equipment, stockers, under-track storage, etc.). For each of these activities, the factory’s MES is notified instantaneously.GEM300 – SEMI E40, E87, E90, E94, E157With the advent of 300mm manufacturing in the mid-to-late 90s, a global team of volunteer system engineers from the leading chip makers defined the GEM300 standards to support fully automated manufacturing operations. Starting at 5:00 o’clock on the infographic, the number of transactions per minute jumps almost 3 orders of magnitude, from the monitoring of 900 control jobs across 4000 process tools to the tracking of 360,000 individual recipe step change events. This level of event granularity is essential for the latest generation of FDC (Fault Detection and Classification) applications, because precise data framing is a key prerequisite for minimizing the false alarm rate while still preventing serious process excursions. In this context, more than 6000 recipe-, product- and chamber-specific fault models may be evaluated every minute.Simultaneously, the applications that monitor instantaneous throughput to prevent “productivity excursions” and identify systemic “wait time waste” situations depend on detailed intra-tool wafer movement events. In a fab with hundreds of multi-chamber, single-wafer processes, 75,000 or more of these events occur every minute. EDA (Equipment Data Acquisition) – SEMI E120, E125, E132, E134, E164, etc.Rounding out the SEMI standards in our example gigafab is the suite of EDA standards which complement the command and control functions of GEM/GEM300 with flexible, high-performance, model-based data collection. The EDA standards enable the on-demand collection of the volume and variety of “big data” required from the equipment to support the advanced analysis, machine learning, and other AI (Artificial Intelligence) applications that are becoming increasingly prevalent in leading semiconductor manufacturers. As EUV (Extreme Ultraviolet) lithography moves from pilot production to high-volume manufacturing at the 7nm process node and beyond, the litho process area will become a major source of process data by itself, generating 10 GB of data every minute. This is in addition to the 100 GB of data collected from other process areas. The End ResultThe final wedge (12:00 o’clock) in our infographic highlights the real objective – which is producing the millions of integrated circuits that fuel our global economy and provide the technologies that are an integral part of our modern way of life. Assuming a nominal die size of 50 square mm (typical of an 8 GB DRAM), the 2.31 wafers we started at 1:00 o’clock result in almost 3200 individual chips. But none of this would be possible without the pervasive factory automation technology we now take for granted. So, as you finish reading this posting on whatever device you happen to be using, take a micro-moment to acknowledge and thank the hundreds of standards volunteers whose insights and efforts made this a reality!You may not be responsible for running a gigafab anytime soon, but the SEMI standards used in this setting are no less applicable to any Smart Manufacturing environment. Give us a call if you’d like to know more about how these technologies can benefit your operations for many years to come.Alan Weber is Vice President, New Product Innovations, at Cimetrix Incorporated. Previously he served on the Board of Directors for eight years before joining the company as a full-time employee in 2011. Alan has been a part of the semiconductor and manufacturing automation industries for over 40 years. He holds bachelor’s and master’s degrees in Electrical Engineering from Rice University. For more information on SEMI Standards, please click here.

What’s next for smarter, more connected electronics manufacturing - Part 3 The fast-maturing infrastructure now enabling analysis of exponentially larger data volumes brings the microelectronics industry to an inflection point, where the winning companies will be the first to master the use of this data to solve the industry’s emerging challenges. SEMI expands its coverage of these vital issues with a Smart Manufacturing Pavilion and three days of talks SEMICON West, July 10-12 in San Francisco. While deep learning is starting to be applied to image recognition for wafer inspection, it is also being considered for sequential pattern recognition in order to evaluate equipment parameter traces. The next emerging applications will start to use those learned patterns to predict outcomes, and then use those predictions to automate process control. One early application of deep learning is IC process development. “People don’t think of research and development as the first place to automate, but it’s where applying our digitization and simulation has first had impact,” says David Fried, Coventor vice president of Computational Products. He noted that insertion is easier in the lab than in the fab. Technology at 10nm and beyond is now so complex that companies at the leading edge must use process modeling to understand the effect of process variation on their designs. Learning cycles can now be accelerated during development by simulating 10,000 digital wafers instead of running 25 actual wafers during screening, Fried says. Applying structured analysis and machine learning to the data simplifies optimization across the 500 or more interrelated process steps. Coventor has recently introduced a statistical analysis package that aids the design and analysis of process variation experiments by using large volumes of data from its models. Fried says these models are next being used to accelerate the yield ramp in manufacturing. Digital simulation also could speed development of high-mix, lower value products While digital twins are best known for their use in complex, high value products like jet engines, the simulation technology could also enable the electronic manufacturing services (EMS) sector to reduce the time, cost and risk of developing its high mix of products. “The EMS sector’s use of digital twins will be vital for it to smooth the move of CAD/CAM digital design data for so many different products into manufacturing, and to accelerate validation testing of designs and products by doing more of it in the virtual world,” says Dan Gamota, vice president of Engineering and Technical Services at Jabil. Gamota also highlights the push for traceability from the automotive and healthcare markets, where the digital models could be used to quickly assure that the design was built exactly as specified. “In the past year, traceability has evolved from just ‘nice to have’ to ‘how to achieve,’” he adds. “Companies are expecting it, but aren’t willing to accept the cost and risk of doing it alone. We need the community to discuss realistic implementations, identify the most critical elements and bring together the ecosystem partners to build baseline reference architectures for key digital building blocks. The community also needs to assure the reliable flow of data among the electronic manufacturing segments from semiconductor to OSAT to EMS.” Predictive maintenance and virtual metrology applications could mature in next few years While predictive maintenance initially seemed a likely early application of machine learning in factories, it remains a challenge for the electronics sector. “The difficulty is that it’s not clear where to get the most bang for the buck,” says Tom Ho, president of BISTel America, noting that it may make the most sense to track the failure performance of a single expensive part, like an electrostatic chuck, since predicting the failure performance of a whole complex system like an etcher is much harder. “Collecting enough data from all failure types, including especially the rare events, is difficult unless you have a long history of a lot of tools,” adds Doug Suerich, PEER Group product evangelist. “The gain from collecting performance information from many tools across the industry could be big, but many companies still need to overcome concerns around exposing their IP.” Another big opportunity for prediction is virtual metrology – predicting the wafer outcome from the process or sensor data with enough accuracy to replace the physical metrology. “Virtual metrology is improving, and since metrology can be slow and expensive, any reduction could mean a huge potential savings,” says Suerich. “But it is still seen as too scary for many companies. Two to three years from now, companies will expand the practice from lower risk areas into processes that require more confidence in the results.” Moving beyond prediction to automated control needs digital models Once the results are predicted, the model can be used to control or automatically optimize a process and enable the system to learn by itself, usually by reinforcement learning on a digital model. The model can then independently make adjustments to optimize the manufacturing process. “Automated process development is getting close now. Instead of smart guys turning the knobs, deep learning is automating the smart tuning,” says Suerich, suggesting the industry could see widespread adoption in as little as two to three years. This type of machine learning needs a good digital model, and masses of data for learning. One approach uses human experts to build a physics-based model of the clearly understood parts of the process, then turns to deep machine learning to optimize the lesser-understood variables. The alternative, the data-first approach, runs a computer algorithm to suggest the solution purely from data, without human input, and then relies on the human to evaluate the usefulness of the results. Modeling digital twins of wafers could enable automated process control, chamber matching, and fleet matching, says Fried. If every wafer had its own virtual twin with all the upstream metrology and structural information needed to make equipment control decisions, it could feed forward that information to enable the seamless transition from one step in the process to another based on understanding their complex interrelationships. This could potentially improve uniformity across wafers and equipment, and reduce the need for metrology, he argues. Moving metrology sensors into the chamber will also require model-based algorithms to enable dynamic process control in close to real time, says Fried. These algorithms will be needed to acquire, parse, and process the data at high speed, and then to choose how to adjust the controls. “There will be a model behind collecting and interpreting the metrology data,” he notes. “That’s a really rich vein for improvements in process control.” “The end goal is to collect equipment data in real time, analyze it with AI, and send back controls to optimize manufacturing processes,” Jabil’s Gamota says. “This requires a robust architecture for communication between equipment and consistent formats for data collection and analysis. But the cost and complexity of this heavy lifting is too great for any one company to do alone. We need a consensus-based architecture for ingesting, analyzing and acting on the data.” SEMI tests data transfer protocols, benchmarks best practices SEMI is launching a smart data project to identify the various data transfer protocols needed for inter-company communications. The project will feature a proof-of-concept model in a development fab to produce verifiable results so SEMI can better understand how different approaches meet member needs. SEMI’s smart manufacturing technology communities and the Fab Owners Alliance are also benchmarking current smart manufacturing practices in the microelectronics industry to help SEMI members better understand the path forward and potential return on investment. Speakers over all three days at SEMICON West addressing these issues include Active Layer Parametrics, Applied Materials, Applied Research Photonics, ASML, Bosch Rexroth, Cimetrix, Coventor, ECI Technologies, Edwards Vacuum, Final Phase Systems, GE Digital, Infineon, Jabil, Lam Research, Osaro, Otosense, PEER Group, Qualcomm, Rockwell Automation, Rudolph Technologies, Schneider Electric, Seagate, Siemens, Stanford University, TEL, TIBCO Software. See semiconwest.org. What’s next for smarter, more connected electronics manufacturing - Part 1 What’s next for smarter, more connected electronics manufacturing - Part 2 Paula Doe, SEMI

What’s next for smarter, more connected electronics manufacturing - Part 2The fast-maturing infrastructure now enabling applications for big data and artificial intelligence means disruptive change not just at individual companies but also in data connections among companies across the microelectronics manufacturing value chain. SEMI checked in with some leading players on the changes they see coming in the next several years for this article series. The trade group is expanding its programming on smart manufacturing to address these industry-wide developments at SEMICON West, July 10-12 in San Francisco.“The ramp of EUV, and the smaller geometries and smaller process margins, will drive an exponential increase in the amount of metrology data to manage,” says Neal Callan, ASML vice president, Silicon Valley. Callan notes that moving to multibeam e-beam inspection will increase data volume from megabytes per second to gigabytes per second and from thousands of data points to millions of data points. “The process is so tight and the margin so small that stochastic variation, or noise, becomes more dominant – at least it’s noise until we can learn to understand and control it. And understanding and controlling this variation will be key to delivering 5nm patterning,” he says.Single-beam e-beam inspection is already driving large increases in data as engineers extend the slow technology to broad, high-speed defect metrology applications by more intelligently instructing the system where to look for problems. Callan says ASML is now using the scanner data on wafer focus, alignment and leveling. The company is also using the computational lithography model from the design to identify the smallest process windows in the pattern that are most likely to see problems. The model then quantifies the number and significance of those instances.“The collection of all this diverse data means that tools will need to be plug-and-play so all tool data is instantly available to all systems and software,” says Doug Suerich, PEER Group product evangelist. “We need tools that can be discovered automatically by the network so it can start slurping up data immediately. The adoption of the Interface A (EDA) standard is accelerating and fabs are starting to ask for it. The proliferation of sensors also needs to self-discover. If you are going to add thousands of new sensors into a facility, you can’t afford a time-consuming integration process.”“We are now seeing that engineers are greedy for more data – if they can get the data, it’s becoming a need-to-have,” adds Tom Ho, BISTel America president. “Getting more data from more sensors, from the sensors on the tool that are not being fully utilized, and from untapped data sources like vibration is another big coming opportunity.” Process complexity drives demand for feed-forward between silos with computational models ASML co-optimizes its scanner process with etch and reticle process steps. Source: ASML In addition to the drive for trace-back of data, the increasing complexity of interrelated processes is also driving demand for feed-forward of data. “Feed-forward is becoming more important,” notes Ho. He points to the example of 3D NAND features, now getting so deep that identifying the layer being measured is a challenge unless the signal at the step before can be recognized. “We need partnerships with our peers to understand how to take advantage of the sensors they use, integrate them with our data, and then feed-forward corrections to the other systems,” concurs Callan. “To drive the best CD uniformity and overlay, we need to co-optimize litho and etch,” agrees Henk Niesing, ASML director of product management. He notes that the company is working with etcher makers to measure the overlay and CD, decompose the finger prints, and then use models to steer automated control that best adjusts both the scanner and the etcher. ASML is also working with Zeiss on co-optimization between the scanner and the reticle to make even higher-order corrections by locally modifying the reticle.These higher-order corrections, applied on each exposed field, drive the need for even more data, and at higher speed but without higher cost, notes Jan Mulkens, ASML senior fellow. These corrections increase demand for computational metrology, which combines various metrology sources with physics and deep learning models trained on real data to predict and control process results in real time. “We’re working on computational metrology to ideally use all the knobs we have in the fab,” he says. So far this effort has largely involved linking data between two companies. More consistent data formats would enable data exchange to be extended to more companies. “The software versions also need to be managed for upgrades so they still match after one party updates the system on its tool,” notes Niesing. Speakers on these issues of smart manufacturing and data handling at SEMICON West include Active Layer Parametrics, Applied Materials, Applied Research Photonics, ASML, Cimetrix, Coventor, ECI Technologies, Edwards Vacuum, Final Phase Systems, GE Digital, Infineon, Jabil, Lam Research, Osaro, Otosense, PEER Group, Rockwell Automation, Rudolph Technologies, Schneider Electric, Seagate, Seimens, Stanford University, TEL, TIBCO Software. See semiconwest.org.What’s next for smarter, more connected electronics manufacturing - Part 1What’s next for smarter, more connected electronics manufacturing - Part 3Paul Doe, SEMI

What’s next for smarter, more connected electronics manufacturing - Part 1The fast-maturing infrastructure now enabling applications for big data and artificial intelligence means disruptive change not just at individual companies but also in data connections among companies across the microelectronics manufacturing value chain. SEMI expands its smart manufacturing program with a Smart Manufacturing Pavilion with displays and three full days of talks to address these industry-wide developments at SEMICON West, July 10-12 in San Francisco.Autonomous autos’ demand for zero-defect systems and 100 percent traceability back to the manufacturing data for each die is driving a push to traceability across the chip sector. “Far more chips are being used by the automotive sector, and its very different requirements are driving demand for traceability,” says Tom Ho, president of BISTel America. “Our chipmaker customers are looking for traceability solutions and the trend is the same in backend packaging and assembly – automotive applications are driving the sector to traceability.”Traceability is also driven by the growth of systems in a package as fabless chipmakers look to connect back to the packaging companies’ fault analysis labs and die interconnect history to diagnose and fix the cases where known-good die are failing in the system, adds Mike Plisinski, CEO of Rudolph Technologies. Plisinski adds that makers of consumer products like phones that can also see harsh conditions are demanding higher quality and traceability as well. The electronic manufacturing services (EMS) sector also must establish an architecture for traceability to collect critical manufacturing-related data and to interface with OSATs and semiconductor fabs. The reason is that EMS companies are adding traditional OSAT processes such as assembly of products with bare die and complex optics modules requiring clean rooms. “A unified sand-to-smart-phone smart manufacturing roadmap should be established,” says Dan Gamota, vice president of Engineering and Technology Services at Jabil. “We need to identify protocols for manufacturing data communications that can be adopted across the supply chain.”To enable smart manufacturing, vendors need to collaborate on getting their production equipment to interoperate and support factory analytics and data management systems. Source: SEMI One big challenge, of course, is how to format this diverse data so it can be linked and used by various supply chain stakeholders. “Smart data needs to be contextual and it needs data standards across the supply chain so it’s easy to link from the front end to the back end, follow common lot IDs front and back end, and have a way to map streaming data from sensors to a discrete lot ID,” notes Ho. New approaches to metrology, analysis and test that increasingly exploit machine learning on simulations will also be needed to help predict which die and connections that test well now may fail in the future as conditions change.Another issue is how to securely share the needed data across companies without jeopardizing IP. “On the equipment side we collect data across customers on how the tool is running to improve the equipment,” notes Neal Callan, ASML VP Silicon Valley. “Next we need to integrate performance and reliability data that today is not as well shared.”The other big hurdle is how to pay for data sharing. “The challenge is that the final manufacturers reap the benefit of traceability, but since they expect their suppliers to deliver good die, they don’t want to pay more for it,” notes Plisinski. He suggests that over the next two to three years, traceability and predictive fault prevention will become the norm as the automotive sector is compelled to invest in it to assure safety. Meanwhile, fabless companies will face so much complexity in integrating different die from different suppliers in SiP that they will no longer be able to afford to simply use the cheapest supplier, potentially driving a fundamental shift in relations and division of labor among fabless chipmakers, OSATs and fabs. Standards extend across supply chainSEMI member committees are collaborating to build the infrastructure to enable these developments. Standards committees are updating standards for higher bandwidth data exchange and extending semiconductor-like vertical and two-way horizontal equipment communication standards to flow shops to enable assembly players to optimize and trace back results across players. The SMT/PCBA community is integrating its smart manufacturing work into SEMI standards, and the SEMI A1 standard was a key reference document in the development of the Japan Robotics Association’s Equipment Link Protocol.Speakers addressing these issues at SEMICON West include Active Layer Parametrics, Applied Materials, Applied Research Photonics, ASML, Bosch Rexroth, Cimetrix, Coventor, ECI Technologies, Edwards Vacuum, Final Phase Systems, GE Digital, Infineon, Jabil, Lam Research, Osaro, Otosense, PEER Group, Qualcomm, Rockwell Automation, Rudolph Technologies, Schneider Electric, Seagate, Siemens, Stanford University, TEL, TIBCO Software. See semiconwest.org.What’s next for smarter, more connected electronics manufacturing - Part 2What’s next for smarter, more connected electronics manufacturing - Part 3Paula Doe, SEMI