Testing Enables the Path Forward: Test Vision Symposium 2023
By Mayura Padmanabhan, SEMI
The 16th annual Test Vision Symposium was held in conjunction with SEMICON WEST at San Francisco on July 12 and July 13, 2023.The theme for 2023 was “Testing Enables the Path Forward” stressing the significance of semiconductor testing in this era where many new fabs are being built.
Day 1 and Day 2 together attracted over 130+ unique attendees to witness 3 keynotes, 4 paper presentation sessions, 1 Poster Presentation session and 1 Panel Discussion. The symposium was put together by the General Chair, Dr. Jeorge Hurtarte (Sr. Director, Teradyne) and the Programs Chair, Alan Liao (Director, FormFactor) with the help from multiple leaders across the semiconductor industry. The committee is thankful to all our 2023 Sponsors (Advantest, AEM, Teradyne, FormFactor, NI, TESEC and Roos Instruments) which helped put together an amazing technical show.
The symposium was inaugurated by honoring the Best ATE Paper of 2022 winner- Brian C. Wadell from Teradyne who presented a paper on “A Handler-based Solution for 60 GHz AiP DUT Testing (and an Early Look at Test Results”. This was followed by the Keynote presentation from Regan Mills (VP, Teradyne) who kept the audience hooked with his presentation on “Semiconductor Manufacturing Symbiosis” following which we had Session 1 and Session 2. Session 1 witnessed 4 papers on ‘Data Analysis and Management’ and Session 2 was focused on ‘Emerging Technologies for Test’ wherein ChatGPT (a large language Model) was used to demonstrate how LLms can be of assistance to test and product engineers.
Day 1 concluded with a Poster Presentation session which saw 10 exciting posters competing to win the Best Poster Award of Test Vision Symposium 2023. Students from National Taiwan University - Pie-Chun Liao and Charleen Liu who shared about “The Dynamic Characteristics of a 1700V 50A 4H-SiC MOSFET via a double pulse test” won the Best Poster Award and were presented with a check and a certificate. Poster Session was held as part of the networking session wherein semiconductor experts passionately chatted about innovations in test technology.
Student Charleen Liu along with Prof. Kyle Lee from National Taiwan University winning the Best Poster Award from Alan Liao
Day 2 opened with a bang with the Keynote Presentation from DR. William (Bill) Chen from the ASE Group whose talk on “Heterogeneous Integration Paving the way for Microelectronics Resurgence” highlighted the importance of Advanced Packaging and Heterogeneous Integration’s role for semiconductor microelectronics future. It was followed by Session 3 which showcased papers on ‘Innovations in Test and Validation for Advanced Semiconductor technologies’. Day 2 also witnessed another keynote presentation from Travis Mosier from mySilicon who talked about “CHIPs Act and its impact to US Semiconductor Assembly and Test” helped shed light on CHIPs Act of the US and how it is helping to revive a resilient supply chain.
Audience actively engaging in the CHIPs Act Keynote session presented by Travis Mosier from mySilicon
The 2-day symposium came to an end after a Panel Discussion on “Form Design to In-Field and Back: The Future of Semiconductor Testing” which was moderated by Anne Meixner, contributing editor at Semiconductor Engineering. The panelists were from different segments of the semiconductor industry - Tom Katsioulas, CEO at Archon Design Solutions and U.S. Department of Commerce IoT advisory board member; Ming Zhang, vice president of R&D Acceleration at PDF Solutions; Marissa Russell, Director of Test Group at Intel; and Uzi Baruch, chief strategy officer at proteanTecs. They were engaged in active discussions with the audience on changes in semiconductor tests that address tracing device quality throughout a product’s lifetime.
Rich Dumene, Principal Test Architect at Renesas Electronics (2023 Vice General Chair) was named the General Chair for 2024 Test Vision Symposium. The Steering Committee thanked all the attendees who were enlightened after 2 days of technical discussions. The Test Vision Symposium (TVS) is proudly brought to you by the Collaborative Alliance for Semiconductor Test (CAST) – CAST develops, coordinates, and directs all SEMI services for the semiconductor test community.
Get Involved
SEMI Standards development activities take place throughout the year in all major manufacturing regions. To get involved, join the SEMI International Standards Program at: www.semi.org/standardsmembership.
For more information, please visit our main Web site and current events page. If you are interested in joining the TVS sub-committee, please drop an email to Mayura Padmanabhan ([email protected]).
Standards Watch
SEMI
www.semi.org
September 14, 2023