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New Standards on Test Cell Data and Events

By Mark Roos, Automated Test Equipment North America Chapter Co-chair, Roos Instruments

This year the Automated Test Equipment (ATE) North America Technical Committee Chapter has completed the first issue of SEMI E183 (Rich Interactive Test Database) and SEMI A4 (Tester Event Messaging for Semiconductors). These standards are the first additions to tester data and event standardization since the STDF V4-2007 standards effort.

To help in understanding SEMI E183, the RITdb team offered a multi hour training session at SEMICON West 2022 Hybrid which was watched by over 20 remote and local attendees. Given the positive feedback we intend to offer a full webinar version later this year.

There is still more standardization needed in the test cell to support modern Smart Manufacturing as well as the complexities of heterogeneous integration and packaging. In addition, the more complex SOCs enabled by today's process nodes require changes to how scan data is collected and managed. In support of these requirements the following efforts are starting:

  • Test cell events cover a wide range of categories and actions ranging from material moves to system errors. These events need to have standard representations and meanings to enable general purpose tooling. A RITdb task force was created to defining a standard for these events.
  • Testing occurs at many points in the creation of semiconductors. From wafer fabs to end users. Each of these points have their own requirements for data types, formats and uses. Part of RITdb is in enabling the transfer of data between these points, therefore, we see a need to define these points and the data interfaces between. A RITdb effort is underway to develop a guide to assist implementors.
  • There are multiple control and data flows on an assembly and test floor currently in use (e.g., RITdb, TEMS, SECS/GEM, Interface A and many others). Smart Manufacturing requires that all of these data sources be visible and, if used for control, interacted with. Discussions are in progress with regards to formulating an interactivity plan.
  • Data security and access control are constant issues for test. The task force is actively looking for solutions for both human and machine authorization processes.
  • Finally, scan testing has come a long way since 2007. Volumes are larger, rates are faster and the need for quick feedback and analysis is growing. Efforts are underway to examine the options using existing and new approaches to handling the large amounts of data expected.

For those looking to participate in these discussions, please join the standards effort via Connect@SEMI. Participation is open to all registered SEMI Standards Program Members. Free to join, get involved today!

Get Involved

SEMI Standards development activities take place throughout the year in all major manufacturing regions. To get involved, join the SEMI International Standards Program at: www.semi.org/standardsmembership.

For more information, please visit our main Web site and current events page. If you have any questions regarding SEMI Standards activities, please contact your local SEMI Standards staff.

 

Standards Watch
SEMI
www.semi.org
September 1, 2022