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SPCC 2026 Bio Sina Kaabipour
Verifying PFAS Abatement in Fab-Relevant Waste Matrices Using Complementary Analytical Characterization TechniquesPer- and polyfluoroalkyl substances (PFAS) are integral components in...
Blog
House Semiconductor Caucus Event Spotlights Challenges & Opportunities Facing the Semiconductor Supply Chain
The House Semiconductor Caucus event held on March 17, 2026 at the Rayburn House Office Building in Washington, D.C. brought together industry leaders for an in-depth panel discussion around the...
Event
North America Standards Winter Meetings 2026
Join us for the SEMI Standards MeetingsVIRTUAL Only! Remember to save the dates for the upcoming Spring meetings (Albany, NY) in conjunction with SEMI ASMC (May 11-14, 2026) and SEMICON West...
Member Press Release
Atronix Inaugurates Albania’s First Advanced Electronics Manufacturing Factory
Tirana, November 2025 – Atronix Sh.p.k., Albania’s pioneering Electronics Manufacturing Services company, officially inaugurated in November its new production facility at Tirana Industrial...
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ISS 2025 Speaker Abstract & Bio - Jeong Kee Kim, World Smart Sustainable Cities Organization
BIOGRAPHYJeong Kee Kim was appointed Secretary General of the World Smart Sustainable Cities Organization (WeGO) on October 1, 2024, by the president of WeGO, who is also the Mayor of the Seoul...
Member Press Release
Agileo Automation Launches The E84 PIO Box For The Enhanced Compliance Testing Of Semiconductor Equipment With SEMI Standards
Innovative plug-and-play device helps conduct comprehensive equipment compliance tests for automatic carrier delivery in automated fabs
SEMICON Europa, Munich, Germany, November 12, 2024 – Agileo...
Member Press Release
MRSI Mycronic introduces next generation high precision epoxy dispenser for advanced packaging
MRSI Mycronic a leading manufacturer of fully automated, high-precision, high-speed, flexible die bonding, active alignment, and epoxy dispensing systems, proudly introduces the next generation high...
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New Activity Proposed for Measuring Surface Particle Contamination on Critical Chamber Components
New Activity Proposed for Measuring Surface Particle Contamination on Critical Chamber ComponentsBy Yitzhak Vanek (Persys), Pedro Godoy (Teilch), and Michelle Sun (SEMI)Particle contamination in...
Member Press Release
Axiomise Launches Next-Generation formalISA App for RISC-V Processors
Axiomise, the leading provider of cutting-edge formal verification solutions that include training, consulting, services and custom apps, today launched its next-generation formalISA® app with...
Member Press Release
MRSI Systems Announces Chinese Patent Issued Covering Die Placement Head with Turret
Mycronic Global Technologies Business Unit, MRSI Systems announces the recent issuance of utility patent titled “DIE PLACEMENT HEAD WITH TURRET” and numbered ZL 201680048482.5 (PCT/US2016/047135) on...