Systems Engineering Inc.

Support the semiconductor industry with optical measurement. Systems Engineering manufactures a new generation "FT-IR SE 50 series"semiconductor material characterization tools equipped with Thermo Fisher Scientific's research grade FTIR and JEL's self-transport system. "FT-IR SE-50 series" focuses purging performance and measurement efficiency with N2, and it makes the industry's highest level of high-precision measurement. We have wide variety of applications to suit customers needs in "SE-50 series". 【Wafer measurement】 ・EPI Thickness ・SiC Thickness ・SOI Thickness ・Carbon & Oxygen in Silicon ・Boron & Phosphorus in BPSG Films ・Hydrogen in Silicon Nitride Films ・Fluorine in SiO2 Films ・Thickness of non-diffusion layer film 【Ingot measurement】 ・Oxygen concentration