Semilab Semiconductor Physics Laboratory Co. Ltd.
Member Since
Sep 21, 2002
Member ID
11024
Website
Location
Prielle Kornélia u. 2
Budapest
H-1117
Germany
Primary Industry
Semiconductor
Primary Product Category
Equipment and Sub-Systems
Primary Product Sub Category
Metrology/Inspection
Company Profile
SEMILAB provides state-of-the-art process control and metrology solutions for semiconductor wafer and device manufacturers, as well as the solar and display industries worldwide.
With over 300 unique products, our growing portfolio offers a wide range of optical and electrical measurement technologies, from tabletop to inline solutions.
LST is the industry standard for monitoring and analysis of bulk microdefects, while Semilab AFM enables nanoscale surface roughness monitoring and defect review of Si, SiC, and GaN samples. PMR monitors various ion implantation parameters in Si and SiC wafer production. EIR is designed for epitaxial thickness characterization. uSE offers high-throughput thin film characterization. En‑Vision targets non-destructive detection of buried defects.
Semilab covers the full R&D lifecycle, from research and metrology development to manufacturing and implementation, enabling efficient production control while ensuring an exceptional user experience.