Molecular Vista, Inc.

Molecular Vista manufactures topographical and chemical metrology equipment to academia, R&D labs, and nanotechnology manufacturing industry. Its products feature photo-induced force microscopy (PiFM), which combines atomic force microscopy (AFM) and infrared (IR) spectro-nanoscopy, to provide surface sensitive and high spatial resolution (sub-5 nm) measurements of structure and chemical make-up of nano-sized structures (intended as well as unintended such as defects) on samples up to 300 mm wafers. One of its products, Vista 300, provides fully automated defect review (3D shape and chemical speciation) based on KLARF coordinates to the semiconductor industry.