Chipmetrics

Chipmetrics provides innovative metrology chips and wafers for advanced process control in the semiconductor industry. Our cutting-edge solutions support thin film process development, tool qualification, and quality assurance across semiconductor and advanced material manufacturing. Our core technology, the PillarHall® Lateral High Aspect Ratio (LHAR) Test Chip, is widely recognized for enabling fast, accurate, and non-destructive evaluation of thin film conformality in 3D structures. Headquartered in Finland, Chipmetrics empowers R&D and production teams worldwide to accelerate innovation and ensure process reliability in next-generation semiconductor device fabrication.