Gazer Semiconductor Tech Co., LTD

Gazer Semiconductor independently developed FTIR film thickness measuring equipment, FTIR element concentration measuring equipment, EDXRF film thickness measuring equipment, etc. The equipment can be compatible with the second/third generation semiconductor wafer measurement, such as Si and SiC, etc., with high detection efficiency, good safety performance, low maintenance cost, easy to use and other advantages. The device can be customized and developed according to customers' usage scenarios to better adapt to customers

盖泽半导体自主研发生产FTIR膜厚测量设备、FTIR元素浓度测量设备、EDXRF膜厚测量设备等。设备可兼容第二/三代半导体晶圆测量，例如Si和SiC等，具有检测效率高、安全性能好、维护成本低、使用简单便捷等优势，设备可根据客户使用场景定制化开发，更好的适应客户。