AVANT Semiconductor Equipment Co.,Ltd
Member Since
Jun 23, 2024
Member ID
1175640
Website
Location
浦东新区盛夏路570号1幢402室
Shanghai
201210
China
Primary Industry
Semiconductor
Primary Product Category
Equipment and Sub-Systems
Primary Product Sub Category
Test Equipment
Company Profile
·基于FTIR技术的外延片厚度和元素浓度测量（EPI Thickness and Element concentration measurement）
·电阻率（载流与浓度）测量（Resistivity (carrier concentration) Measurement）
·晶圆边缘缺陷检测（Wafer Edge Defect Inspection）
·碳化硅晶圆位错和微管检测（SiC Wafer Dislocation & Micropine Inspection）
·碳化硅表面检测（SiC Wafer Surface Inspection）
·光学关键尺寸测量（OCD）
·晶圆键合（Wafer Bonding）和超声波检测（SAT）