Fab processes have become unimaginably complex with petabytes of data generation each day. Fab end customers in multiple market segments are demanding highly reliable chips with zero defect escapes!
With the recent technological advancements, most fabs have gone through (or will be going through) Digital Transformation which enables data integration. Still, about 80% of the data generated is not yet fully utilized. This webinar discusses how to achieve zero defect manufacturing in the fab with a five-step program providing fab use cases at each step covering challenges, solution, and benefits.
Fabs are not new to zero defect initiatives, however, it is more exciting and promising now with the advent of AI to achieve zero defect manufacturing in fabs.
Speaker:
Prasad Bachiraju (Director, Sales and Customer Solutions)
Prasad Bachiraju is the director of business development and product marketing for Onto Innovation’s enterprise software business. With over 26 years of experience in the semiconductor industry, Prasad’s mission and passion is to work hand-in-hand with customers to build solutions using yield management and advanced process control systems. He began his career in the semiconductor industry at INSPEX Inc as a software engineer III in the DMS division prior to its acquisition by Rudolph Technologies in 1997. Prasad spent two decades at Rudolph in various engineering and customer facing roles prior to the Rudolph Technologies and Nanometrics merger in 2019 that formed Onto Innovation. Prasad has authored many papers collaborating with customers on reduced review and wafer level pattern recognition topics. He received a master’s in computer applications.