Material Analysis Techniques for Advanced Packaging Development
ABSTRACT
This presentation will provide an overview of some of the critical material characterization techniques being used in advanced semiconductor packaging. These techniques can be used to help support process development efforts, process insertion into manufacturing, yield excursions and Failure analysis.
Company Overview:
With two decades of dedicated service, Cerium Laboratories has established itself as a leading material characterization and process development laboratory within the semiconductor industry. Our company supports a broad spectrum of clients, including substrate manufacturers, chemical suppliers, equipment producers, integrated circuit (IC) manufacturers, as well as packaging and testing facilities.
Headquartered in Austin, Texas, Cerium Laboratories not only offers global support but also collaborates with some of the most respected national laboratories and Universities in the United States. Now, we leverage our extensive experience in semiconductor manufacturing to provide support for the Texas Institute of Electronics (TIE), offering on-site support in process development, technology transfer, and workforce development to advanced industry capabilities and innovation.
BIOGRAPHY
Tim Z. Hossain obtained a Ph.D. in Chemistry (University of Kentucky, 1982). He was employed at Eastman Kodak Company (1982-1989) -primarily working with silver halide chemistry. He moved to Texas Instruments (1989 – 1992) and worked on semiconductor process technology such as CVD (Chemical Vapor Deposition). After a short academic assignment at Cornell University (1992-1995) he joined AMD, Inc in 1995 (1995 -2011) and continue to develop chemical process technology for semiconductor manufacturing. He was promoted to be an AMD Fellow. In 2011 Tim became Chief Scientist for Cerium Laboratories, a spin–off from AMD.
Tim gained vast experience in analytical technology to resolve materials problems in semiconductor manufacturing. In this regard he is a pioneer in applying nuclear methods of analysis for high purity semiconductor materials.
Tim published over 100 technical papers and was granted over 35 patents. He is a co-author of the discovery of the cosmic ray neutron effect on Memory chips1. 1R. Baumann, T. Z. Hossain, S. Murata, H. Kitagawa, Boron compound as a dominant source of alpha particles in semiconductor devices, Proceedings of the 33rd annual international reliability physics symposium, p.297 (1995).