BIOGRAPHY
Cornel Bozdog is a metrology expert with over 20 years’ experience in the Semiconductor Industry. In his current role with Onto Innovation, he nurtures the development of novel optical tools and algorithms for metrology and process control of semiconductor device manufacturing. Earlier in his career, he managed the metrology roadmap of Micron Technology in Boise, ID, developed Atomic Force Microscopy to image buried features with Nearfield Instruments, and led many industry-first projects and collaborations in optical and X-ray metrology with Nova Measuring Instruments.
Cornel holds a PhD in Physics from Lehigh University in PA. He published over 50 journal and conference papers and has over 10 patents on metrology and semiconductor processing area.