JP Kummer Semiconductor Technology GmbH
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JP Kummer Semiconductor Technology GmbH
Member Since
Jan 1, 2003
Member ID
16289
Website
Location
Steinerne Furt 78
Augsburg
86167
Germany
Primary Industry
Semiconductor
Primary Product Category
Services
Primary Product Sub Category
Distributor, Manufacturing Representative
Company Profile
Analysis/Measurement: Film Thickness, Microscopes, Probing Equipment/Accessories, Surface Inspection/Flatness - Surface and defect inspection, SEM CD Overlay. Assembly/Hybrid Equipment: Automation & Robotics, Burn-In, Cleaning Equipment, Inspection. FLAT PANEL DISPLAY (FPD) - Materials: Developer/Stripping & Cleaning/Etchants/Other. FLAT PANEL DISPLAY (FPD) - Processing Equipment: CVD, Wet Etching/Stripping. FLAT PANEL DISPLAY (FPD) - Test/Measurement/Repair Equipment: Optical Test, Surface Inspection/Flatness, Thickness Measurement. Photomask Equipment/Materials: Mask Making Equipment. Process Equipment: Handling/Transfer/Linear Motion Systems, Inspection Equipment, Laser Beam Equipment, Flat Panel Display, Manufacturing Equipment. Services: Training.
JP Kummer Semiconductor Technology GmbH is a specialist European distributor of Manufacturing Equipment, Inspection and Metrology tools mainly for the Semiconductor Industry. Using our long established relationships within the worldwide Industry we bring the newest and most technologically advanced products to the European market. We are specalist for: wafer prober, probe card analyzer and avalanche tester, wafer thickness/geometry/resistivity measurements, surface inspection, R2R and S2S coating, Ultrasonic Coating, decapsulation (mechanical, by laser and etching) and de-layering systems, SEM/TEM Sample preparation equipment, Scanning Acoustic Microscope, Photon Emission Microscopy, Scanning Optical Microscopy, Laser Timing Probe, Thermal Microscopy, Magnetic Field Microscopy, AFM-in-SEM, Vacuum bake/Vapor prime ovens, calibration standards, Topography and Deformation Measurement (TDM), AOX and AOI, SECS/GEM and automation software.
JP Kummer Semiconductor Technology GmbH is a specialist European distributor of Manufacturing Equipment, Inspection and Metrology tools mainly for the Semiconductor Industry. Using our long established relationships within the worldwide Industry we bring the newest and most technologically advanced products to the European market. We are specalist for: wafer prober, probe card analyzer and avalanche tester, wafer thickness/geometry/resistivity measurements, surface inspection, R2R and S2S coating, Ultrasonic Coating, decapsulation (mechanical, by laser and etching) and de-layering systems, SEM/TEM Sample preparation equipment, Scanning Acoustic Microscope, Photon Emission Microscopy, Scanning Optical Microscopy, Laser Timing Probe, Thermal Microscopy, Magnetic Field Microscopy, AFM-in-SEM, Vacuum bake/Vapor prime ovens, calibration standards, Topography and Deformation Measurement (TDM), AOX and AOI, SECS/GEM and automation software.