SEMICON Southeast Asia 2018: Novel Ways of Using Data (Text and Images) from Intel’s Assembly and Test Factory (ATM)

Duncan Lee, Principal Engineer of Manufacturing IT, Factory Automation at Intel, discusses factory automation, process/equipment source of defect identification, and leveraging data. Data Fuels Predictive Maintenance and Quality. Unstructured Images analysis enables defect identification and predictive maintenance. The combination of conventional image processing and artificial intelligence plus statistics tremendously enhances defect sources (prior equipment etc.) identification. From SEMICON Southeast Asia in May 2018 in Kuala Lumpur, Malaysia. Learn more at: http://www.intel.com/IT

Keywords: Automation, Industrial, Defects, AI