AGENDA:
8:00 AM Welcome Remarks
8:05 AM Sponsor Presentation
8:10 AM Speaker talk: The Growing Importance of MEMS Reliability
8:40 AM Panel discussion on the growing importance of MEMS reliability
9:00 AM Closing
SPEAKER BIOS:
Mary Ann Maher
Chief Executive Officer, SoftMEMS
Dr. Mary Ann Maher received her Ph.D. from Caltech in 1989 in the area of semiconductor device modeling. She has over 30 years of experience in the area of electronic design automation (EDA) for MEMS, sensors, and analog circuits. She held positions at Tanner Research and MEMSCAP before starting SoftMEMS in 2004 to provide design software to the microsystems market. She currently serves as CEO of SoftMEMS.
Sixto Arjonilla
Quality Director of Motion Sensors, NXP
Dr. Arjonilla has a background in electrical engineering and more than 30 years of international experience in the field of semiconductors. He has worked in design, product engineering, manufacturing, and quality and has held management positions in Spain, Germany, and the US. Since 2015 he has been the Quality Director of Motion Sensors in NXP. Dr. Arjonilla has served as Technical Advisor of the European Space Agency for space components and currently is co-chair of the Reliability Working Group of the MEMS & Sensors Industry Group. Dr. Arjonilla received his M.S. in Electrical Engineering and Computer Sciences from the Polytechnic University of Madrid, MBA from CEPADE Business School, and Ph.D. in Economics from the University of Cadiz.
Anupam Choubey
Principal Technical Lead, Draper Lab
Dr. Anupam Choubey works as Principal Microsystems and heterogeneous integration technical Lead, developing packaging technologies at Draper Lab. He specializes in Microsystems Integration, MEMS packaging, extreme environment. He received his Ph.D. in Mechanical Engineering from the University of Maryland and has been contributing to the field of Microsystems packaging and reliability for over 15 years. Prior to Draper, he worked for NASA/JPL and led engineering development efforts for NASA missions such as the recently landed Perseverance MARS rover, INSIGHT, OSIRIS-REX, JUNO, and EUROPA.
Srikanth Ganesan
Senior Manager MEMS/CMOS Reliability, TDK InvenSense
Dr. Srikanth Ganesan has a background in Materials Science and more than fifteen years of experience in the Hard Disk drive/magnetics industry. In his current position, he oversees the Reliability Engineering group at TDK InvenSense, working to improve the reliability of MEMS devices for consumer and automotive applications. He specializes in sensor design, validation, and reliability organizations. He received his B.S in Metallurgical Engineering from the Indian Institute of Technology, Chennai, India, and M.S./Ph.D. degrees from Stanford University’s Materials Science department.