Westford, MA, February 4, 2020: Hitachi High-Tech Analytical Science Corporation (Hitachi High-Tech Analytical Science), a Hitachi High-Technologies Corporation (TSE: 8036) wholly owned subsidiary engaged in the manufacture and sales of analysis and measuring instruments, today introduces the new FT160 XRF analyzer with three base configuration options for the analysis of nanometer scale coatings.
Following the introduction of the new FT160 series in Japan, Hitachi High-Tech Analytical Science now sells and services the FT160 series coatings analyzers in China, North America, Europe, Middle East and Africa. This latest generation of Hitachi coatings analyzers has been designed to meet the challenges of measuring ultra-thin coatings on small features. The FT160 is a benchtop EDXRF (energy dispersive X-ray fluorescence) analyzer with powerful software and hardware created to deliver high sample throughput with quality results achieved by any operator. Designed to play a key role in production quality control, the FT160 series measures a wide range of applications in the semiconductor, circuit board and electronics components markets.
Measure nm-scale coatings
The FT160 features high-end components to provide the ultimate analysis of ultra-thin coatings on fine structures. A polycapillary optic focuses the X-ray beam down to a diameter of
