The Model 431-TT is Tesec’s newest DC Parametric Test System, which employs a new architecture with V/I Source Measurement Modules.
The 431-TT is designed for Power Device testing and features high-speed test measurement and data capture, parallel device testing and an on-screen Waveform Monitor.
Features:
• VI Source Measure Modules Structure
• Measurable up to 8kV with High Voltage external option unit, 2.2 kV per 200A on the main unit and 1.200A with external High Current option module
• High Speed Measurement
• Multi-device test (2 DUT simultaneous measurement of 2 in 1 devices and etc.)
• Wafer parallel test (2-chip simultaneous measurement)
• On Screen Waveform Monitor
• High Current Unit, High Voltage Unit as option
