President CT Associates, Inc.
Gary Van Schooneveld, President of CT Associates, Inc., is a leading authority in nano-scale particle detection with over 35 years of semiconductor industry experience. He specializes in sub-10 nm particle measurement in liquids and on silicon wafers, optimizing aerosol-based techniques that extend detection to 1.8 nanometers, far surpassing conventional optical methods limited to 20-30nm. His expertise encompasses particle precursor detection methodologies essential for identifying contamination sources that form particles on wafer surfaces, establishing crucial correlations between liquid contamination and on-wafer defects through collaborative studies with major manufacturers.
Gary serves as Co-chair of the IRDS Critical Components Task Force and the SEMI Ultrapure Water Task Force, leading development of multiple industry standards including SEMI F121 for particle precursor metrology. Recent honors include the SEMI Leadership Award (2024) and Advance Nanocontamination Measurement Service Award (2025). He is author of over 60 technical papers and holds BS and MS degrees in Materials Engineering from Rensselaer Polytechnic Institute and an MBA from UT Arlington.