BIOGRAPHY
Dr. Ady Levy serves as Sr. Vice President and General Manager of the data analytics (MACH) division at KLA. Ady joined KLA in 1995 leading system engineering in the wafer inspection division. He was part of the team that invented and developed the scatterometry CD (optical CD), AIM imaging overlay and scatterometry overlay (SCOL) technologies. He then led the marketing and application teams of the optical metrology division and later joined KLA’s strategic business development team. In 2012 he joined the patterning solution group to establish and lead the data analytics team.
Prior to joining KLA, Ady was a researcher at the IBM Watson Research Division specializing in semiconductor devices, microscopy and short pulse optics. He completed his Ph.D. at M.I.T focusing on the transition between semiconducting and superconducting field effect transistors. He is an inventor and co-inventor of more than 50 patents in semiconductor inspection, metrology and analytical instrumentation.