Information and Control Japan TC Chapter Meeting

July 25, 2019

Information and Control Japan TC Chapter meeting

Thursday, July 25, 2019, Begin 13:00 –End 17:00

SEMI Japan office, Tokyo, Japan

Agenda 

1  Welcome / Call to Order
1.1  Introductions
1.2  Meeting Reminders (Membership Requirement, Antitrust and Intellectual Property Reminders, Effective Meeting Guidelines)
1.3  Agenda Review

2  Review of Previous Meeting
2.1  Review and Approval of Previous Meeting Minutes
2.2  Action Items from the previous meeting

3  Liaison Report
3.1  Europe
3.2  Korea
3.3  North America
3.4  Taiwan
3.5  CAST (Collaborative Alliance for Semiconductor Test)
3.6  North America Automated Test Equipment
3.7  Staff Report

4  Ballot Review
4.1  6300C: New Standard or Safety Guideline (including replacement of an existing Standard or Safety Guideline)
4.2  6377B: Line Item revision to SEMI E5-1217: SEMI EQUIPMENT COMMUNICATIONS STANDARD 2 MESSAGE CONTENT (SECS-II)
4.3  6481A: Line Item Revision to SEMI E174-0618: SPECIFICATION FOR WAFER JOB MANAGEMENT (WJM)

5  Subcommittee & Task Force Reports
5.1  GEM300 TF
5.2  Japan I&C Maintenance TF
5.3  Sensor Bus TF
5.4  Diagnostic Data Acquisition (DDA) TF
5.5  Fab & Equipment Information Security Task Force
5.6  Backend Factory Integration Task Force
5.7  Equipment Data Acquisition (EDA) Working Group

6  Old Business
6.1  SNARF Project Period Check
6.2  5 Year Review Check
6.2.1  E98.1 Provisional Specification for SECS-II Protocol for the Object Based Equipment Model

7  New Business

8  Action Item Review
8.1  Open Action Items
8.2  New Action Items

9  Next Meeting and Adjournment

Standards Contact Information:

Mizue Iwamura
Coordinator, Standards, SEMI Japan
Email: [email protected] 
Phone: 81-3-3222-5760

Note: Standards meetings are open to all, but you must be a SEMI Standards Program Member to attend. If you are not a Member, please join the Standards Program and start making a big contribution to the industry’s progress, complete an application form today