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February 16, 2027 - February 18, 2027

Gap analysis 2027

Join us for a three-day workshop uniting SEMI Technology Coalitions: FlexTech, NBMC, and CAST

The workshop will delve into advancements, challenges, and gaps in critical technologies such as flexible hybrid electronics, hybrid electronics, and bio-signal sensing for real-time cognitive and physical state monitoring and augmentation and will feature AI for Metrology (AI4MT) sessions

Time

8:00 am - 6:00 pm EDT

Add to Calendar 2027-02-16 08:00:00 2027-02-18 18:00:00 Flex Technology Workshop 2027 Join us for a three-day workshop uniting SEMI Technology Coalitions: FlexTech, NBMC, and CASTThe workshop will delve into advancements, challenges, and gaps in critical technologies such as flexible hybrid electronics, hybrid electronics, and bio-signal sensing for real-time cognitive and physical state monitoring and augmentation and will feature AI for Metrology (AI4MT) sessions NeoCity Academy 200 NeoCity Way Kissimmee, FL 34744 United States SEMI.org [email protected] America/New_York public
Location

NeoCity Academy
200 NeoCity Way
Kissimmee, FL 34744
United States

Gap analysis 2027

Industry Tours


Take advantage of exclusive industry tours at SkyWater Technology and NeoCity Academy

Day 1 | Innovation Forum 


Hear the latest advances from FlexTech and NBMC alongside technical presentations from researchers and technology leaders developing tomorrow's semiconductor innovations.

Day 2 | Technical Gap Analysis 


Participate in collaborative breakout sessions that examine technology gaps, explore roadmaps, and help shape future FlexTech and NBMC research priorities. Your expertise will directly contribute to discussions that influence future Request for Proposal (RFP) directions.

Day 3 | AI for Metrology Workshop 

This workshop brings together industry, academia, and standards leaders to explore how AI can connect metrology, failure analysis, and test data across the semiconductor supply chain. As chiplets, heterogeneous integration, and advanced packaging drive complexity, AI-assisted defect localization and root-cause analysis backed by non-destructive modalities and targeted physical characterization are becoming essential to closing the loop from electrical failure back to physical origin.

An evening reception will follow the event.

Including with registration are breakfasts, breaks, lunches and receptions.

Sponsors

Florida semiconductor Engine NSF
University of Florida logo
Neocity Florida Logo