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Session 6

Equipment Optimization

Session Chairs: Fred Bouchard, Misty Thompson, Viji Seshachalam

Advanced manufacturing requires timely information, robust parts and a solid understanding of the interplay between components and process. This session will focus on new ways to calibrate epi chambers, coatings to protect chamber components and prevent flaking, impact of plating nozzles on copper voiding, and modeling of elastomer aging in sealing applications.

Wednesday, May 3, 2023

9:10 AM ET 
6.1 Plasma Corrosion Resistant ALD Coatings for Semiconductor Manufacturing Process Equipment 
Lassi Leppilahti, Beneq 

9:35 
6.2 Qualification and Optimization of New Post-WCMP Cleaning Chemical for ReRAM Process 

Samrat Paul, Hong Jin Kim, Kevin Hanley, GlobalFoundries 

10:00 
6.3 Predicting Aging Effects and Permanent Set of Vacuum Sealing Systems in Semiconductor Manufacturing Processes 

Alan Astbury, Christoph Wehmann, Ambarish Kulkarni, Feyzan Durn, Murat Gulcur, Trelleborg Sealing Solutions 

10:25 
6.4 A comprehensive Study on Spin-On-Dielectric (SOD) Voids: Root Cause Analysis, Impact, and Amelioration 
Ketaki Sarkar, Johnny Nieves, Laud Abantei, Arika Fritz, Aayush Mittal, Michael Hurt, Micron Technology 

10:50 
6.5 Chemical Uniformity Impacts on Electrodeposition 
Joel Christian Warner, Adam Anthony Chalupa, Jarett Clay Martin, Marcus Minchew, Samsung Austin Semiconductor 

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