Big Data, Automation and Analytics 2
Session Chairs: Paul Werbaneth, Dave Gross
The availability of vast amounts of data is now being met with increasing compute capabilities and algorithmic approaches to predict properties of final products, equipment health and metrology results, and influence WIP flow decisions.
Thursday, May 4, 2023
9:30 AM ET
15.1 The Impact of Data Fragmentation on Processing Time Modeling in Semiconductor Manufacturing
Valeria Borodin, Claude Yugma, Mines Saint-Etienne; Narendiran Gopinathan Chembu, Abdelhak Khemiri, Jasper van Heugten, Minds.ai
9:55
15.2 Deploying an Integrated Framework of Fab-wide and Toolset Schedulers To Improve Performance in a Real Large-scale Fab
Semya Elaoud, Dennis Xenos, Flexciton; Tina O’Donnell, Seagate Technology
10:20
15.3 Graphical approach of equipment health monitoring using network analysis
Wanwook ki, Minjae choi, yongjun lee, Kiseop yoon, Hanchan hwang, Jisoo park, taewook kang, Jaeyong park, younghoon kim, Samsung Electronics
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