A New Test Industry Agenda

Executive Test Summit
A New Test Industry

Tuesday, July 14, 2009
3:45pm – 4:45pm
Test Assembly and Packaging TechXPOT
South Hall

The unprecedented economic challenges of today’s semiconductor industry are most pronounced in the test segment, and will perhaps endure longer in test than other sectors of the industry. These economic challenges threaten continued innovation and call for new business models, new customer care and R&D strategies, and new approaches to pre-competitive industry collaboration by leading test companies. This session will feature the top executives from the leading semiconductor test companies who share their outlook and vision for the industry, taking questions from their customers, financial analysts and the audience.

     

Mark E. Jagiela
President, Semiconductor Test Division,
Teradyne

Dave Tacelli
CEO & President
LTX-Credence

Keith Barnes
Chairman, CEO & President
Verigy Limited

R. Keith Lee
President and CEO
Advantest America

Rick Nelson
Chief Editor
Test & Measurement World

Moderator

 
   

This was a panel discussion with no presentations