Even before the economic downturn, test strategies by IDMs and outsource testing firms were dramatically being transformed by new test methodologies, multisite test, BIST, test optimization techniques, increasing reliance on structural test and other new approaches. These new technologies, processes and methodologies are still being developed and evaluated and will emerge with force during the next upturn, potentially altering the landscape for test engineers, suppliers, and customers. This session will provide insights into the new test strategies and test challenges by leading device makers, experts and OSATS.

1:30pm-1:50pm

Testing after an Economic Tsunami (View Presentation – PDF)
Ron Leckie, president.
INFRASTRUCTURE Advisors

1:50pm-2:10pm

Design Validation and Test: The Next Red Brick Wall (View Presentation – PDF)
Navid Shahriari, director, sort test technology development
Intel Corporation

2:10pm-2:30pm

Transformation in Test – An OSAT Perspective (View Presentation – PDF)
Mark M. Berry, test product manager, vice president
Amkor Technology

2:30pm-2:50pm

Appropriate Actions in Tough Times (View Presentation – PDF)
Dave Armstrong, director of product development/marketing
Advantest America Inc.

2:50pm-3:10pm

Semiconductor Test in the Third Dimension (View Presentation – PDF)
Erik H. Volkerink, chief scientist
Verigy

3:10pm-3:30pm

Building Software-Defined, Characterization Test Systems for Complex Chip Designs (View Presentation – PDF)
Scott Savage, semiconductor market development manager
National Instruments

Session Moderator

Nick Langston, president, Liberty Research Co.