STIL Usage Guide
CAST: STIL Usage Guides (English & Japanese)
Today’s typical semiconductor test floors are filed with multiple families of ATE, each with their own proprietary programming language. Migration of test programs across the various ATE is difficult and time consuming, and often results in inefficient equipment loading of ATE. The IEEE 1450 Standard Group has done an excellent job of defining a common data format (STIL) of ATE. This common format is starting to be used across various vendors’ ATE platform as well as multiple third-party software generation and conversation tools. Customers are asking for help in accelerating the adoption and usage of the STIL standard. The STIL Working Group will be focused on driving a common interpretation and usage of STIL to enable interoperability of STIL through the industry. Effort in the STIL Working Group will be closely aligned with IEEE 1450 Standard Group.
STIL Usage Guides (As of 19 March, 2012)
1. Current Version (Rev6.30)
- STIL Usage Guides (in English)
<IEEE 1450.0>
<IEEE 1450.1>
<IEEE 1450.2>
<IEEE 1450.3>
- STILUsageGuide1450.3_Rev4.00
- STILUsageGuide1450.3ChangingPoint
- TesterConstraintParameterFile_Rev2.00
<IEEE 1450.6>
<Evaluation Suits of Compliance>
[IEEE 1450.0/2]
- Evaluation Data Set (Base, Mix, Keyword)
- Criteria on STIL Usage Guide by STIL Basic Data
- Criteria on STIL Usage Guide by STIL Mixed Data
- Blank_Sheets_for_evaluation_result_Rev2.20
[IEEE 1450.3]
<Evaluation Result of Compliance>
- Summary of Evaluation Results
- Details of Evaluation Results
- STIL Usage Guides (in Japanese)
<IEEE 1450.0>
<IEEE 1450.1>
<IEEE 1450.2>
<IEEE 1450.3>
- STILUsageGuide1450.3_Rev4.00
- STILUsageGuide1450.3ChangingPoint
- TesterConstrainsParameterFile_Rev2.00
<IEEE 1450.6>
<Evaluation Suits of Compliance>
[IEEE 1450.0/2]
- Evaluation Data Set (Base, Mix, Keyword)
- Criteria on STIL Usage Guide by STIL Basic Data
- Criteria on STIL Usage Guide by STIL Mixed Data
- Blank_Sheets_for_evaluation_result_Rev2.20
[IEEE 1450.3]
<Evaluation Result of Compliance>
- Summary of Evaluation Results
- Details of Evaluation Results
2. Previous Version (Rev6.20)
- STIL Usage Guides (in English)
<IEEE 1450.0>
<IEEE 1450.1>
<IEEE 1450.2>
<IEEE 1450.3>
- STILUsageGuide1450.3_Rev4.00
- STILUsageGuide1450.3ChangingPoint
- TesterConstraintParameterFile_Rev2.00
<IEEE 1450.6>
<Evaluation Suits of Compliance>
- Evaluation Data Set (Base, Mix, Keyword)
- Criteria on STIL Usage Guide by STIL Basic Data
- Criteria on STIL Usage Guide by STIL Mixed Data
- Blank_Sheets_for_evaluation_result_Rev2.25
< Evaluation Result of Compliance>
- STIL Usage Guides (in Japanese)
<IEEE 1450.0>
<IEEE 1450.1>
<IEEE 1450.2>
<IEEE 1450.3>
- STILUsageGuide1450.3_Rev4.00
- STILUsageGuide1450.3ChangingPoint
- TesterConstrainsParameterFile_Rev2.00
<IEEE 1450.6>
<Evaluation Suits of Compliance>
- Evaluation Data Set (Base, Mix, Keyword)
- Criteria on STIL Usage Guide by STIL Basic Data
- Criteria on STIL Usage Guide by STIL Mixed Data
- Blank_Sheets_for_evaluation_result_Rev2.25
< Evaluation Result of Compliance>
3. Previous(Old) Version (Rev6.10)
- STIL Usage Guides (in English)
<IEEE 1450.0>
<IEEE 1450.1>
<IEEE 1450.2>
<IEEE 1450.3>
- STILUsageGuide1450.3_Rev4.00
- STILUsageGuide1450.3ChangingPoint
- TesterConstraintParameterFile_Rev2.00
<IEEE 1450.6>
<Evaluation Suits of Compliance>
- Evaluation Data Set (Base, Mix, Keyword)
- Criteria on STIL Usage Guide by STIL Basic Data
- Criteria on STIL Usage Guide by STIL Mixed Data
- Blank_Sheets_for_evaluation_result_Rev2.10
<Evaluation Result of Compliance>
- STIL Usage Guides (in Japanese)
<IEEE 1450.0>
<IEEE 1450.1>
<IEEE 1450.2>
<IEEE 1450.3>
- STILUsageGuide1450.3_Rev4.00
- STILUsageGuide1450.3ChangingPoint
- TesterConstrainsParameterFile_Rev2.00
<IEEE 1450.6>
<Evaluation Suits of Compliance>
- List of Critical Items
- Evaluation Data Set (Base, Mix, Keyword)
- Criteria on STIL Usage Guide by STIL Basic Data
- Criteria on STIL Usage Guide by STIL Mixed Data
- Blank_Sheets_for_evaluation_result_Rev2.10
<Evaluation Result of Compliance>
