downloadGroupGroupnoun_press release_995423_000000 copyGroupnoun_Feed_96767_000000Group 19noun_pictures_1817522_000000Member company iconResource item iconStore item iconGroup 19Group 19noun_Photo_2085192_000000 Copynoun_presentation_2096081_000000Group 19Group Copy 7noun_webinar_692730_000000Path
Skip to main content
Henry Chu_1000x1000

Staff Application Engineer, Advantest Malaysia

Advantest

Mr. Henry Chu is a Staff Application Engineer at Advantest Malaysia, bringing over 21 years of experience in system-level and semiconductor testing. In his current role, he provides customer support for ATE test applications and production operations. His primary focus is on power analog controllers within the automotive sector.

Prior to joining Advantest, Henry was involved in power management and RF system-level testing, further strengthening his expertise across a broad range of semiconductor applications.

Presentation Title
High Energy Test Challenges & Opportunities in Wide Bandgap Power Devices

The rapid adoption of Wide Bandgap (WBG) technologies - such as Silicon Carbide (SiC) and Gallium Nitride (GaN) - is reshaping the power semiconductor landscape with higher efficiency, superior thermal performance, and unprecedented voltage‑current handling capabilities. However, these advantages come with significant test challenges. This session highlights the available solutions in delivering high precision, safety, and efficiency needed for next‑generation WBG device testing.