Europe PV Standard Update - May 2013

Europe PV Standard Update

By Yann Guillou, SEMI Europe

The European PV Automation and PV Materials Technical Committees met in Berlin, Germany in conjunction with SEMI PV Fab Managers Forum in March 2013.

The PV Automation Committee approved a Standard New Activity Document 5566 : “Line Item Revision to SEMI PV002-00-0709E Guide for PV Equipment Communication Interfaces (PVECI), modify requirement [PV02-RQ-00007-00] to allow implementation of new namelist requests instead of required documentation”.  The ballot review result is expected to occur during the EU Standard week in October 2013, in conjunction with SEMICON Europa (Dresden, Germany).

Four documents issued by the PV Silicon Materials Task Force of PV Materials Technical Committee passed the ballot reviews:

  • New Standard: Test Method for In Line Measurement of Lateral Dimensional Characteristics of Square and Pseudo Square PV Silicon Wafers
  • New Standard: Specification for Orientation Fiducial Marks for PV Silicon Wafers
  • Line Item Revision to SEMI PV40-0912, Test Method for In-Line Measurement of Saw Marks on PV Silicon Wafers by a Light Sectioning Technique Using Multiple Line Segments
  • Line Item Revision to SEMI PV39-0912, Test Method for In-Line Measurement of Cracks in PV Silicon Wafers by Dark Field Infrared Imaging

These 4 documents were reviewed and approved by the International Standards Committee Audit and Review Subcommittee in April 2013 and  will be published shortly in the PV Standards volume.

In addition, a new activity was approved by the committee. The PV Silicon Materials Task Force will work on Document 5565 “Line Item Revision to PV42, Test Method for In-Line Measurement of Waviness on PV Silicon Wafers by a Light Sectioning Technique Using Multiple Line Segments”.

The next PV Material Technical Committee meeting is planned in conjunction with Intersolar Europe, on June 20th in Munich (Germany).

SEMI, Standards Watch - May 2013