Japan FPD Metrology Overview

By Naoko Tejima, SEMI Japan

The Japan FPD Metrology Standards Technical Committee, co-chaired by Ryoichi Watanabe (Japan Display Central) and Akira Kawaguchi (Otsuka Electronics), has been active mainly in the review of the draft documents from the Korea and Taiwan FPD Metrology Standards Technical Committee. The ballot review meeting has been held in the every ballot cycle and all documents related FPD which were submitted in the cycle has been reviewed one by one in a careful manner.

On the other hand, D31 Revision Task Force under this technical committee has been working to revise SEMI D31-1102 with title change from “Definition of Measurement Index (SEMU) for Luminance Mura in FPD Image Quality Inspection” to “Definition of Measurement Index (DSEMU) for Luminance Mura in FPD Image Quality Inspection” for more than 3 years.

This revised document already passed the committee review in November, and it would be published if it successfully passed A&R committee review.

Keizo Ochi, Konica Minolta Optics, the Japan FPD Metrology Standards Committee members, led the D31 Revision Task Force and dedicated to complete the revision of SEMI D31 as the Task Force leader.

If you have any questions regarding SEMI Standards participation or would like to join the  Japan FPD Metrology Standards Committee Technical Committee, please contact Naoko Tejima at ntejima@semi.org.