ASMC 2018 Agenda

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2018 Conference Agenda

For individual sessions, click on links below.
 

Monday, April 30, 2018

 1:30pm-6:15pmWomen in Semiconductors at ASMC 2018 
 6:30pm-7:30pm Registration and Welcome Reception   
 

Tuesday, May 1, 2018

 7:30-8:30amRegistration and Networking Breakfast (Student Meet Up)
 8:30-8:45amWelcome to the Conference (2018 Conference Co-chairs: Prof. Agnes Roussy, EMSE and Raymond Van Roijen, GLOBALFOUNDRIES); 2017 Best Paper Awards 
 8:45-9:45amKeynote  
  TBC
 9:45-10:05amNetworking Break - Sponsor 
 10:05-12:15pmTechnical Sessions (parallel)  
  Session 1 –  Defect Inspection I
  Session 2 –  Factory Optimization I
 12:15-1:30pmNetworking Lunch
 1:30-3:35pmTechnical Sessions (parallel)
  Session 3 – Yield Management
  Session 4 – Advanced Metrology I
 3:35-4:00pmNetworking Break - Sponsor 
 4:00pmTutorial: Big Data Analytics and the Smart Factory in Microelectronics Manufacturing
 Professor James Moyne
Associate Research Scientist, Mechanical Engineering
University of Michigan, Applied Materials - Global Services
 5:15-6:45pmSession 5 – Poster Session/Reception - Sponsor  
 

Wednesday, May 2, 2018

 7:30-8:00amRegistration - City Center Lobby
 8:00-9:00amKeynote:  
 Anda Mocuta, Ph.D.
Director, Technology Solutions & Enablement, imec
imec
 9:00-9:20amNetworking Break - Sponsor 
 9:20-11:30amTechnical Sessions (parallel)
  Session 6 – Advanced Process Improvement  
  Session 7 – Advanced Patterning / Design for Manufacturability
 11:30am-12:25pmBoxed Lunch
 12:25-2:05pmTechnical Sessions (parallel) 
  Session 8 – Defect Inspection II   
  Session 9 – Contamination Free Manufacturing
 2:05-2:30pmNetworking Break - Sponsor 
 2:30-4:05pmSession 10 – Factory Optimization II
  Session 11 – Advanced Metrology II
 4:15-5:45pmPanel Discussion 
  Industry 4.0 and the Evolution of Smart Semiconductor Manufacturing
 6:30-7:45pmSaratoga Reception - Canfield Casino
 

Thursday, May 3, 2018

 8:00amRegistration
 8:30-9:45amTechnical Sessions (parallel)
  Session 12  Advanced Process Control (APC)
  Session 13 – Factory Optimization III
 9:45-10:00amNetworking Break - Sponsor 
 10:00-11:20amSession 14 – Defect Inspection III
  Session 15 – Advanced Materials & Photonics
 11:25-12:15pmKeynote: 
  Robert Maire (biography)
President 
Semiconductor Advisors
 12:20pmClosing Remarks