Call for Participants: Interlaboratory Study on PV28-0212 Test Methods for Measuring Resistivity or Sheet Resistance with a Single-Sided Noncontact Eddy-Current Gauge
By Kevin Nguyen, SEMI
SEMI PV28-0212 Test Methods for Measuring Resistivity or Sheet Resistance with a Single-Sided Noncontact Eddy-Current Gauge, published in February 2012, were created by the SEMI North America PV Electrical & Optical Properties Measurements Task Force.
The purpose of this test method is to standardize analytical protocols for the measurement of resistivity in PV silicon materials. This will facilitate comparison of test results between laboratories which support research and development activities or monitor or qualify PV silicon materials for purchase, sale or internal use.
These test methods outline the principles of eddy-current measurements as they relate to silicon bricks and ingots or silicon films on nonconductive substrates that are used in photovoltaic sensors. These test methods are very similar to those in SEMI MF673, which covers the principles of eddy-current measurements as they relate to silicon wafers and certain thin films fabricated on such substrates, but the nature of the apparatus is significantly different to accommodate the bricks and ingots.
Interested laboratories are being solicited for the interlaboratory study in establishing precision statement of this test method. Those laboratories wishing to participate in this study should send a memo to Danh Nguyen (Danh@lehighton.com) or Chris Moore (email@example.com), the leader of the SEMI PV Electrical & Optical Properties Measurements Task Force. Or contact SEMI Staff, Kevin Nguyen (firstname.lastname@example.org) for more information.
SEMI Standards Watch, October 2013