Chris Bishop is the R&D Metrology Manager for Micron Technology, a role he has held for the last 8 years. In this role, he is responsible for both development and operations of all stand alone in-line metrology. His previous experience includes both Metrology and Photolithography development engineering in Microns R&D facilities. He joined Micron Technology in 1992 after graduating from Colorado State University with a bachelor’s degree in mechanical engineering. Chris lives in Boise with his wife Amy and son Noah. On the weekends, chances are you can find him outside, either hiking, fishing, skiing, or cycling in the foothills.