CAST Workshop: Implementing Adaptive Test

Wednesday, November 06, 2013
8:00 AM-6:00 PM

Thursday, November 07, 2013
Open Working Group Sessions
8:00 AM-12:00 PM

SEMI Headquarters
3081 Zanker Road
San Jose, CA 95134

According to the International Technology Roadmap for Semiconductors (ITRS), “The need for better integrated usage of this test output (data) for fab process yield learning, maverick material identification, and feedback within a more distributed manufacturing test are all becoming more critical and even essential applications moving forward.”

One approach to effectively managing big data in test is addressed through Adaptive Test. Under the direction of their Steering Committee leadership, the SEMI Collaborative Alliance for Semiconductor Test (CAST) intends to support the implementation of Adative Test via pre-competitive working Groups and Standards activities.  This Workshop will review the AT Roadmap and listen to requirements and perspectives from key adopters of the technology.  After a status of the current Working Groups, the workshop will then discuss and identify plans support implementation of the ITRS Adaptive Test Roadmap.

Latest ITRS Adaptive Test Update 

The ITRS Test Committee recently completed this white paper on the definitions, attributes and benefits of Adaptive Test.  The purpose of the CAST Workshop is to help facilitate the adoption of Adaptive Test through the most effective and economical methods.
Wednesday, November 6
 
8:00am-8:30amContinental Breakfast
 
8:30am-8:40amWelcome
Tom Morrow, Chief Marketing Officer, SEMI
 
8:40am-9:10amITRS Adaptive Test Roadmap Overview
Peter Maxwell, Aptina
 
9:10am-9:30amIDM Perspective on Implementing Adaptive Test
Jeffrey Roehr, Texas Instruments
  
9:30am-9:50amFabless Perspective on Implementing Adaptive Test
James Willmore, Qualcomm
 
9:50am-10:10amSolutions Provider Perspective
Eran Rousseau, Optimal Test
 
10:10am-10:30amSolutions Provider Perspective
Wesley Smith, Galaxy Semiconductor Intelligence
 
10;30am-10:45amBreak
 
10:45am-11:30amPanel Discussion
 
11:30am-12:00pmIdentify Summary and Conclusions from morning presentations
 
12:00pm-1:00pmLunch and Networking
 
1:00pm-1:45pmSTDF Working Group Status and Adaptive Test Perspective
Ajay Khoche
 
1:45pm-2:30pmATE Data Interface Working Group
Lorenzo Simonini, Teradyne
 
2:30pm-3:00pmBreak

3:00pm-4:30pmOpen Discussion on Adaptive Test Implementation

4:30pm-5:00pmWrap-up
Tom Morrow and Ron Leckie
 
5:00pm-6:30pmReception and Networking
 
Thursday, November 7
Note: These are Parallel Meetings
 
8:00am-9:00amCLOSED CAST Steering Committee Meeting

9:00am-12:00pmOpen ATE Data Interface Working Group
 
9:00am-12:00pmOpen STDF Working Group
 
 

SEMI Member: $99
Non Member:   $99

For questions, please contact:

Agnes Cobar
1.408.943.7952
acobar@semi.org