Test Vision 2020

Test Vision 2020 to Address Emerging Test Strategies, Technologies, and Application Challenges

Critical trends and developments in the technologies, methodologies, and application challenges in semiconductor test will be presented at the 6th annual IEEE Test Vision 2020 Workshop held in conjunction with SEMICON West 2013, on July 10-11 at the San Francisco Marriot Marquis Hotel. The one and one-half day workshop will feature speakers from Flextronics, Broadcom, Qualcomm, Texas Instruments, AMD, ON Semiconductor, Mentor Graphics, Micron, along with those from key semiconductor test industry suppliers. Organized by SEMI and sponsored by the IEEE Instrumentation and Measurement Society, Test Vision 2020 is a two-time winner of the ATE Test Technology Technical Council’s “Most Successful Event” Award.  Registration for Test Vision 2020 is now open at www.testvision2020.com, and includes free admission to SEMICON West.

Test Vision 2020

The Test Vision 2020 Workshop (July 10-11) is a one and one-half day workshop featuring speakers from Flextronics, Broadcom, Qualcomm, Texas Instruments, AMD, ON Semiconductor, Mentor Graphics, Micron, along with those from key semiconductor test industry suppliers. Organized by SEMI and sponsored by the IEEE Instrumentation and Measurement Society, Test Vision 2020 is a two-time winner of the ATE Test Technology Technical Council’s “Most Successful Event” Award.  Registration for Test Vision 2020 is now open at www.testvision2020.com, and includes free admission to SEMICON West.

Test Vision 2020 has become the leading venue to learn, forecast and debate the future of semiconductor test and serves as a valuable platform where leading foundries, IDMs and fabless companies discuss their critical test requirements with leading test equipment and solution providers.  This year’s program will feature panel discussions and leading industry experts that focus on the following key questions:

  • How can we achieve faster time to market with lower product costs?
  • What are the Test challenges in emerging technologies?
  • How much Test is enough?
  • What are the possible paths to economical high-speed test?
  • What are the next big innovations in Semiconductor Test?
  • What will be the new skills and competencies needed by future test engineers?

The keynote speaker for Test Vision 2020 will be Dr. Erik Volkerink, Chief Technology Officer at leading end-to-end supply chain powerhouse, Flextronics.  He will present on the topic, “Product Foundry: Next Paradigm in Product Design and Engineering.” Featured speaker will be Sri Jandhyala, Strategic Marketing Director for ON Semiconductor, whose presentation will be, “LED Lighting — Opportunities, Challenges and the Future.”  Leading test equipment and solution providers will also highlight the latest test developments and trends, including speakers from Advantest, LTX-Credence, Roos Instruments, and Teradyne.

Starting at 3:00pm on Wednesday, July 10 and concluding at 4:45pm on Thursday, July 11, Test Vision 2020 will also include a networking and casual social event on Wednesday evening.  

For more information on Test Vision 2020, visit www.testvision2020.com or visit the SEMICON West website at www.semiconwest.org.

Test TechXPOT

SEMICON West also features a Test TechXPOT (North Hall) on July 9 with the theme, "Semiconductor Test: Smarter, Faster, More Productive" focusing on the latest trends and developments to improve yield, advances in probe card technology, adaptive test integration and 3D-IC test. 

Martin Keim from Mentor Graphics will speak on "Text Data-- A Key Asset for Effective Yield Learning," full of practical suggestions for test engineers, product engineers, and design engineers.  Danny Glotter from OptimalTest will discuss "Big Data breakthrough at Top 5 Fabless Companies" with a focus on what it takes to manage "Big Data" and the ROI resulting from such advanced capabilities.

From Advantest, Angarai Sivaram will present on a "New ATE Instrument for PCI-Express Protocol Testing."  Representing Multitest Electronics Systems, James Quinn  will discuss "Quality in 3D Assembly: Is KGD Good Enough?"  Luke Schreier from National Instruments will address the issue of "Increasing Test Coverage and Speed with USer-Programmable FPGA's" which have the greatest opportunity for short-term impact.  

The last presentation of the day features Charlie Weinberger of Texas Instruments tackling "Assembling the Wrong Die! A Quality Issue in the Wings."

To learn more about the TechXPOT on Semiconductor Test, visit: www.semiconwest.org/node/8516

For more information on SEMICON West 2013, please visit: www.semiconwest.org.

Register now for SEMICON West 2013 before cost of registration increases on June 7: http://www.semiconwest.org/registration.

June 4, 2013