Two New Classes Offered at SEMI HQ: Fundamentals of Yield; Thin-Film PV Reliability
On March 27, a new Fundamentals of Yield class deals with the complex and
increasingly difficult process of Yield Analysis. Today, engineers are required to locate defects on
complex integrated circuits. In many ways, this is akin to locating a needle in
a haystack, where the needles get smaller and the haystack gets bigger every
year. Fundamentals of Yield is a one-day course that offers detailed
instruction on a variety of effective tools, as well as the overall process
flow for identifying, locating and characterizing the defects, process variations,
and design/manufacturing interactions responsible for the low yields.
On April 18, the new Thin-Film Photovoltaics Reliability class addresses the issue of “Is it possible to predict the future stability of Modules?” Thin-film photovoltaic CdTe and Cu(In,Ga)Se2 (CIGS) modules consist of a large-number of series-connected, individual cells that are packaged to withstand 10-20 years of outdoor exposure. Direct correlations between accelerated lifetime testing (ALT) of cells and outdoor field testing of modules is difficult due to the many, complex ways modules fail. However, cell-level ALT is useful for understanding degradation at the cell component level. Recent data shows a good correlation between future Voc degradation and the magnitude of hysteresis observed in cells immediately after fabrication thus providing an important discussion point: can we predict the future stability of modules?
February 5, 2013